Shigeyuki Kakuta

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Multichannel photometric measurement apparatus
- Patent number 8,547,544
- Issue date Oct 1, 2013
- Yokogawa Electric Corporation
- Kumiko Horikoshi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring film thickness
- Patent number 7,646,489
- Issue date Jan 12, 2010
- Yokogawa Electric Corporation
- Kazufumi Nishida
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INFRARED ANALYSIS APPARATUS
- Publication number 20120218542
- Publication date Aug 30, 2012
- YOKOGAWA ELECTRIC CORPORATION
- Yasushi ICHIZAWA
- G01 - MEASURING TESTING
Information Patent Application
MULTICHANNEL PHOTOMETRIC MEASUREMENT APPARATUS
- Publication number 20120019815
- Publication date Jan 26, 2012
- YOKOGAWA ELECTRIC CORPORATION
- Kumiko Horikoshi
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING FILM THICKNESS
- Publication number 20080266550
- Publication date Oct 30, 2008
- YOKOGAWA ELECTRIC CORPORATION
- Kazufumi NISHIDA
- G01 - MEASURING TESTING