Shigeyuki Matsubara

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Osaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for nondestructive inspection
- Patent number 9,032,799
- Issue date May 19, 2015
- Mitsubishi Heavy Industries, Ltd.
- Hidetaka Hattori
- G01 - MEASURING TESTING
Information Patent Grant
Ultrasonic wave testing method and ultrasonic testing device using...
- Patent number 8,225,668
- Issue date Jul 24, 2012
- Independent Administrative Institution Japan Aerospace Exploration Agency
- Hideki Yabushita
- G01 - MEASURING TESTING
Information Patent Grant
Ultrasonic testing method and ultrasonic testing device using this
- Patent number 8,024,975
- Issue date Sep 27, 2011
- Independent Administrative Institution Japan Aerospace Exploration Agency
- Hideki Yabushita
- G01 - MEASURING TESTING
Information Patent Grant
Ultrasonic test method and ultrasonic test instrument used for the...
- Patent number 7,721,606
- Issue date May 25, 2010
- Independent Administrative Institution Japan Aerospace Exploration Agency
- Makoto Shirai
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR NONDESTRUCTIVE INSPECTION
- Publication number 20110259104
- Publication date Oct 27, 2011
- Hidetaka Hattori
- G01 - MEASURING TESTING
Information Patent Application
Ultrasonic Wave Propagating Method and Ultrasonic Propagating Devic...
- Publication number 20090165561
- Publication date Jul 2, 2009
- Hideki Yabushita
- G01 - MEASURING TESTING
Information Patent Application
Ultrasonic Testing Method and Ultrasonic Testing Device Using This
- Publication number 20080302188
- Publication date Dec 11, 2008
- Independent Administrative Institution Japan Aerospace Explaration Agency
- Hideki Yabushita
- G01 - MEASURING TESTING
Information Patent Application
Ultrasonic Test Method And Ultrasonic Test Instrument Used For The...
- Publication number 20080127731
- Publication date Jun 5, 2008
- Independent Administrative Institution Japan Aerospace Exploration Agency
- Makoto Shirai
- G01 - MEASURING TESTING