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Shigeyuki Morishita
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Estimation model generation method and electron microscope
Patent number
11,842,880
Issue date
Dec 12, 2023
Jeol Ltd.
Ryusuke Sagawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of measuring aberration and electron microscope
Patent number
11,764,029
Issue date
Sep 19, 2023
Jeol Ltd.
Shigeyuki Morishita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Scanning transmission electron microscope and aberration correction...
Patent number
11,087,951
Issue date
Aug 10, 2021
Jeol Ltd.
Shigeyuki Morishita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Aberration corrector and charged particle beam device
Patent number
10,755,888
Issue date
Aug 25, 2020
Jeol Ltd.
Shigeyuki Morishita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron microscope
Patent number
10,720,302
Issue date
Jul 21, 2020
Jeol Ltd.
Shigeyuki Morishita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Distortion correction method and electron microscope
Patent number
10,446,362
Issue date
Oct 15, 2019
Jeol Ltd.
Shigeyuki Morishita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Aberration computing device, aberration computing method, image pro...
Patent number
10,332,721
Issue date
Jun 25, 2019
Jeol Ltd.
Shigeyuki Morishita
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for computing angular range for measurement of ab...
Patent number
10,332,719
Issue date
Jun 25, 2019
Jeol Ltd.
Shigeyuki Morishita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of aberration correction and charged particle beam system
Patent number
10,014,152
Issue date
Jul 3, 2018
Jeol Ltd.
Shigeyuki Morishita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam system and method of aberration correction
Patent number
9,892,886
Issue date
Feb 13, 2018
Jeol Ltd.
Shigeyuki Morishita
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Electron Microscope, Multipole Element for Use Therein, and Control...
Publication number
20240145210
Publication date
May 2, 2024
JEOL Ltd.
Shigeyuki Morishita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of Adjusting Charged Particle Optical System and Charged Par...
Publication number
20240145211
Publication date
May 2, 2024
JEOL Ltd.
Shigeyuki Morishita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Aberration Correcting Device and Electron Microscope
Publication number
20230268155
Publication date
Aug 24, 2023
JEOL Ltd.
Shigeyuki Morishita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Aberration Corrector and Electron Microscope
Publication number
20230253181
Publication date
Aug 10, 2023
JEOL Ltd.
Shigeyuki Morishita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Electron Microscope and Method of Correcting Aberration
Publication number
20230026970
Publication date
Jan 26, 2023
JEOL Ltd.
Keito Aibara
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Estimation Model Generation Method and Electron Microscope
Publication number
20220262595
Publication date
Aug 18, 2022
JEOL Ltd.
Ryusuke Sagawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of Measuring Aberration and Electron Microscope
Publication number
20220230838
Publication date
Jul 21, 2022
JEOL Ltd.
Shigeyuki Morishita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Scanning Transmission Electron Microscope and Aberration Correction...
Publication number
20200266025
Publication date
Aug 20, 2020
JEOL Ltd.
Shigeyuki Morishita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Aberration Corrector and Charged Particle Beam Device
Publication number
20190304739
Publication date
Oct 3, 2019
JEOL Ltd.
Shigeyuki Morishita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Electron Microscope
Publication number
20190272971
Publication date
Sep 5, 2019
JEOL Ltd.
Shigeyuki Morishita
G01 - MEASURING TESTING
Information
Patent Application
Distortion Correction Method and Electron Microscope
Publication number
20180366295
Publication date
Dec 20, 2018
JEOL Ltd.
Shigeyuki Morishita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Charged Particle Beam System and Method of Aberration Correction
Publication number
20170365442
Publication date
Dec 21, 2017
JEOL Ltd.
Shigeyuki Morishita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of Aberration Correction and Charged Particle Beam System
Publication number
20170236681
Publication date
Aug 17, 2017
JEOL Ltd.
Shigeyuki Morishita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Aberration Computing Device, Aberration Computing Method, Image Pro...
Publication number
20160041064
Publication date
Feb 11, 2016
JEOL Ltd.
Shigeyuki Morishita
G01 - MEASURING TESTING
Information
Patent Application
Device and Method for Computing Angular Range for Measurement of Ab...
Publication number
20160020066
Publication date
Jan 21, 2016
JEOL Ltd.
Shigeyuki Morishita
H01 - BASIC ELECTRIC ELEMENTS