Shigeyuki Yamaguchi

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Itabashi-ku, JP

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Patents Grantslast 30 patents

Information Patent Grant
Positioning system and method
- Patent number 9,213,104
- Issue date Dec 15, 2015
- Kabushiki Kaisha Topcon
- Kazuhiro Ogawa
- G01 - MEASURING TESTING
Information Patent Grant
Measuring method and measuring device
- Patent number 8,384,913
- Issue date Feb 26, 2013
- Kabushiki Kaisha Topcon
- You Sasaki
- G01 - MEASURING TESTING
Information Patent Grant
Laser scanner, laser scanner measuring system, calibration method f...
- Patent number 8,355,118
- Issue date Jan 15, 2013
- Kabushiki Kaisha Topcon
- Kazuhiro Ogawa
- G01 - MEASURING TESTING
Information Patent Grant
Laser scanner, laser scanner measuring system, calibration method f...
- Patent number 8,310,653
- Issue date Nov 13, 2012
- Kabushiki Kaisha Topcon
- Kazuhiro Ogawa
- G01 - MEASURING TESTING
Information Patent Grant
RTK-GPS survey system
- Patent number 7,482,974
- Issue date Jan 27, 2009
- Kabushiki Kaisha Topcon
- Kazuhiro Ogawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Laser Scanner, Laser Scanner Measuring System, Calibration Method F...
- Publication number 20120218546
- Publication date Aug 30, 2012
- Kabushiki Kaisha TOPCON
- Kazuhiro Ogawa
- G01 - MEASURING TESTING
Information Patent Application
Measuring Method And Measuring Device
- Publication number 20110080596
- Publication date Apr 7, 2011
- Kabushiki Kaisha TOPCON
- You Sasaki
- G01 - MEASURING TESTING
Information Patent Application
Laser scanner, laser scanner measuring system, calibration method f...
- Publication number 20100256940
- Publication date Oct 7, 2010
- Kabushiki Kaisha TOPCON
- Kazuhiro Ogawa
- G01 - MEASURING TESTING
Information Patent Application
POSITIONING SYSTEM AND RECEIVING TERMINAL USED THEREIN
- Publication number 20080281520
- Publication date Nov 13, 2008
- Kazuhiro Ogawa
- G01 - MEASURING TESTING
Information Patent Application
RTK-GPS survey system
- Publication number 20070268179
- Publication date Nov 22, 2007
- Kabushiki Kaisha TOPCON
- Kazuhiro Ogawa
- G01 - MEASURING TESTING