Fremont, CA, US
Information
Patent Grant
Xilinx, Inc.
Shih-Cheng Hsueh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Xilinx, Inc.
Kevin T. Look
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Xilinx, Inc.
Kevin T. Look
G01 - MEASURING TESTING
Information
Patent Grant
Xilinx, Inc.
Kevin T. Look
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Xilinx, Inc.
Shih-Cheng Hsueh
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Xilinx, Inc.
Kevin T. Look
G01 - MEASURING TESTING
Information
Patent Grant
Xilinx, Inc.
Kevin T. Look
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Xilinx, Inc.
Kevin T. Look
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Xilinx, Inc.
Kevin T. Look
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Xilinx, Inc.
Kevin T. Look
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Xilinx, Inc.
Kevin T. Look
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Xilinx, Inc.
Kevin T. Look
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Xilinx, Inc.
Kevin T. Look
G01 - MEASURING TESTING
Information
Patent Application
Xilinx, Inc.
Kevin T. Look
G01 - MEASURING TESTING
