TREA

Shih-Cheng Wu

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  • Hsinchu Hsiang, TW
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Patents Grantslast 30 patents

  • Information Patent Grant

    Vertical probe device
    • Patent number 7,400,156
    • Issue date Jul 15, 2008
    • MJC Probe Incorporation
    • Shih-Chang Wu
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Vertical type high frequency probe card
    • Patent number 7,368,928
    • Issue date May 6, 2008
    • MJC Probe Incorporation
    • Hsin-Hung Lin
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents