Shih-Hao Shih

Person

Hsinchu, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Exhaust system with u-shaped pipes
- Patent number 11,994,809
- Issue date May 28, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yu-Fu Lin
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
EUV lithography mask with a porous reflective multilayer structure
- Patent number 11,809,075
- Issue date Nov 7, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chih-Tsung Shih
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Exhaust system with u-shaped pipes
- Patent number 11,681,232
- Issue date Jun 20, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yu-Fu Lin
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Reticle backside inspection method
- Patent number 11,657,492
- Issue date May 23, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Zi-Wen Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Receiver and internal TCM decoder and associated decoding method
- Patent number 11,290,309
- Issue date Mar 29, 2022
- Faraday Technology Corp.
- Shih-Yi Shih
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
EUV lithography mask with a porous reflective multilayer structure
- Patent number 11,086,209
- Issue date Aug 10, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chih-Tsung Shih
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Reticle backside inspection method
- Patent number 10,997,706
- Issue date May 4, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Zi-Wen Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Exhaust system with u-shaped pipes
- Patent number 10,983,447
- Issue date Apr 20, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yu-Fu Lin
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Methods and apparatus for removing contamination from lithographic...
- Patent number 10,852,649
- Issue date Dec 1, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Zi-Wen Chen
- G01 - MEASURING TESTING
Information Patent Grant
Sigma-delta analog-to-digital converter and operation method thereof
- Patent number 10,693,490
- Issue date Jun 23, 2020
- Faraday Technology Corp.
- Chiao-Min Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Methods and apparatus for removing contamination from lithographic...
- Patent number 10,534,279
- Issue date Jan 14, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Zi-Wen Chen
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for removing contamination from lithographic...
- Patent number 10,509,334
- Issue date Dec 17, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd
- Zi-Wen Chen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Extreme ultraviolet lithography system with debris trapper on exhau...
- Patent number 10,162,277
- Issue date Dec 25, 2018
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shang-Chieh Chien
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Receiver and signal receiving method thereof
- Patent number 8,611,444
- Issue date Dec 17, 2013
- Infomax Communication Co., Ltd.
- Shih-Yi Shih
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Gas conduit for a load lock chamber
- Patent number 6,997,217
- Issue date Feb 14, 2006
- Macronix International Co., Ltd.
- Shih-Hao Shih
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pressure differential measuring tool
- Patent number 6,820,491
- Issue date Nov 23, 2004
- Taiwan Semiconductor Manufacturing Co., Ltd
- Jain-Fa Lin
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for trapping a toxic gas
- Patent number 6,273,935
- Issue date Aug 14, 2001
- Taiwan Semiconductor Manufacturing Company, Ltd
- Shih-Chang Shih
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Method of calibrating WEE exposure tool
- Patent number 6,042,976
- Issue date Mar 28, 2000
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wen-Chong Chiang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
EUV Lithography Mask With A Porous Reflective Multilayer Structure
- Publication number 20240377720
- Publication date Nov 14, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chih-Tsung Shih
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
EXHAUST SYSTEM WITH U-SHAPED PIPES
- Publication number 20240310741
- Publication date Sep 19, 2024
- Taiwan Semiconductor Manufacturing Co., LTD
- Yu-Fu Lin
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
LINK DOWN DETECTOR AND LINK DOWN DETECTING METHOD FOR ETHERNET
- Publication number 20240129213
- Publication date Apr 18, 2024
- FARADAY TECHNOLOGY CORPORATION
- Po-Hsuan LEE
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
EUV Lithography Mask With A Porous Reflective Multilayer Structure
- Publication number 20230384663
- Publication date Nov 30, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chih-Tsung Shih
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
EXHAUST SYSTEM WITH U-SHAPED PIPES
- Publication number 20230333489
- Publication date Oct 19, 2023
- Taiwan Semiconductor Manufacturing Co., LTD
- Yu-Fu Lin
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
MACHINE TOOL WITH A THERMAL COMPENSATION EFFECT
- Publication number 20220152765
- Publication date May 19, 2022
- AWEA MECHANTRONIC CO., LTD.
- SHIH-SYUE SHIH
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
EUV Lithography Mask With A Porous Reflective Multilayer Structure
- Publication number 20210364907
- Publication date Nov 25, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chih-Tsung Shih
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
RECEIVER AND INTERNAL TCM DECODER AND ASSOCIATED DECODING METHOD
- Publication number 20210314202
- Publication date Oct 7, 2021
- FARADAY TECHNOLOGY CORP.
- Shih-Yi Shih
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Exhaust System with U-Shaped Pipes
- Publication number 20210232054
- Publication date Jul 29, 2021
- Taiwan Semiconductor Manufacturing Co., LTD
- Yu-Fu Lin
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHODS AND APPARATUS FOR REMOVING CONTAMINATION FROM LITHOGRAPHIC...
- Publication number 20200150550
- Publication date May 14, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Zi-Wen CHEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS AND APPARATUS FOR REMOVING CONTAINMINATION FROM LITHOGRAPHI...
- Publication number 20190101838
- Publication date Apr 4, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Zi-Wen Chen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
RETICLE BACKSIDE INSPECTION METHOD
- Publication number 20190102875
- Publication date Apr 4, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Zi-Wen CHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Exhaust System with U-Shaped Pipes
- Publication number 20190079418
- Publication date Mar 14, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yu-Fu Lin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
EUV LITHOGRAPHY MASK WITH A POROUS REFLECTIVE MULTILAYER STRUCTURE
- Publication number 20180314144
- Publication date Nov 1, 2018
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chih-Tsung Shih
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Extreme Ultraviolet Lithography System with Debris Trapper on Exhau...
- Publication number 20180173117
- Publication date Jun 21, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shang-Chieh Chien
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
RECEIVER AND SIGNAL RECEIVING METHOD THEREOF
- Publication number 20120328054
- Publication date Dec 27, 2012
- MaxRise Inc.
- Shih-Yi SHIH
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Pressure differential measuring tool
- Publication number 20040065153
- Publication date Apr 8, 2004
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Jain-Fa Lin
- G01 - MEASURING TESTING
Information Patent Application
Gas conduit for a load lock chamber
- Publication number 20030213143
- Publication date Nov 20, 2003
- Shih-Hao Shih
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Robot arm having wafer-scratching prevention function
- Publication number 20030197388
- Publication date Oct 23, 2003
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shih-Chang Shih
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS

Shih-Hao Shih

Person

Patents Grantslast 30 patents

Exhaust system with u-shaped pipes

EUV lithography mask with a porous reflective multilayer structure

Exhaust system with u-shaped pipes

Reticle backside inspection method

Receiver and internal TCM decoder and associated decoding method

EUV lithography mask with a porous reflective multilayer structure

Reticle backside inspection method

Exhaust system with u-shaped pipes

Methods and apparatus for removing contamination from lithographic...

Sigma-delta analog-to-digital converter and operation method thereof

Methods and apparatus for removing contamination from lithographic...

Methods and apparatus for removing contamination from lithographic...

Extreme ultraviolet lithography system with debris trapper on exhau...

Receiver and signal receiving method thereof

Gas conduit for a load lock chamber

Pressure differential measuring tool

Apparatus and method for trapping a toxic gas

Method of calibrating WEE exposure tool

Patents Applicationslast 30 patents

EUV Lithography Mask With A Porous Reflective Multilayer Structure

EXHAUST SYSTEM WITH U-SHAPED PIPES

LINK DOWN DETECTOR AND LINK DOWN DETECTING METHOD FOR ETHERNET

EUV Lithography Mask With A Porous Reflective Multilayer Structure

EXHAUST SYSTEM WITH U-SHAPED PIPES

MACHINE TOOL WITH A THERMAL COMPENSATION EFFECT

EUV Lithography Mask With A Porous Reflective Multilayer Structure

RECEIVER AND INTERNAL TCM DECODER AND ASSOCIATED DECODING METHOD

Exhaust System with U-Shaped Pipes

METHODS AND APPARATUS FOR REMOVING CONTAMINATION FROM LITHOGRAPHIC...

METHODS AND APPARATUS FOR REMOVING CONTAINMINATION FROM LITHOGRAPHI...

RETICLE BACKSIDE INSPECTION METHOD

Exhaust System with U-Shaped Pipes

EUV LITHOGRAPHY MASK WITH A POROUS REFLECTIVE MULTILAYER STRUCTURE

Extreme Ultraviolet Lithography System with Debris Trapper on Exhau...

RECEIVER AND SIGNAL RECEIVING METHOD THEREOF

Pressure differential measuring tool

Gas conduit for a load lock chamber

Robot arm having wafer-scratching prevention function