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Shih-Po Lin
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Taipei Hsien, TW
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last 30 patents
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Patent Grant
Method for measuring an effective channel length of a MOSFET
Patent number
6,750,673
Issue date
Jun 15, 2004
United Microelectronics Corp.
Heng-Sheng Huang
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Clamp for affixing a wafer in an etching chamber
Patent number
6,106,664
Issue date
Aug 22, 2000
ProMOS Technologies, Inc.
Ray Lee
H01 - BASIC ELECTRIC ELEMENTS