SHIH-YUAN MA

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NEW TAIPEI CITY, TW

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Patents Grantslast 30 patents

Information Patent Grant
Method for overlay error correction
- Patent number 12,242,202
- Issue date Mar 4, 2025
- NANYA TECHNOLOGY CORPORATION
- Shih-Yuan Ma
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Marks for overlay measurement and overlay error correction
- Patent number 12,002,765
- Issue date Jun 4, 2024
- NANYA TECHNOLOGY CORPORATION
- Shih-Yuan Ma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for overlay error correction and method for manufacturing a...
- Patent number 11,796,924
- Issue date Oct 24, 2023
- NANYA TECHNOLOGY CORPORATION
- Shih-Yuan Ma
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR OVERLAY ERROR CORRECTION
- Publication number 20230213874
- Publication date Jul 6, 2023
- NANYA TECHNOLOGY CORPORATION
- Shih-Yuan MA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MARKS FOR OVERLAY MEASUREMENT AND OVERLAY ERROR CORRECTION
- Publication number 20230215809
- Publication date Jul 6, 2023
- NANYA TECHNOLOGY CORPORATION
- Shih-Yuan MA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MARK FOR OVERLAY MEASUREMENT
- Publication number 20230213872
- Publication date Jul 6, 2023
- NANYA TECHNOLOGY CORPORATION
- SHIH-YUAN MA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR OVERLAY ERROR CORRECTION AND METHOD FOR MANUFACTURING A...
- Publication number 20230213873
- Publication date Jul 6, 2023
- NANYA TECHNOLOGY CORPORATION
- SHIH-YUAN MA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE STRUCTURE
- Publication number 20230205074
- Publication date Jun 29, 2023
- NANYA TECHNOLOGY CORPORATION
- SHIH-YUAN MA
- H01 - BASIC ELECTRIC ELEMENTS