Shihcheng Hsueh

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Fremont, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Testing vias and contracts in integrated circuit
- Patent number 7,046,026
- Issue date May 16, 2006
- Xilinx, Inc.
- Tai-An Chao
- G01 - MEASURING TESTING
Information Patent Grant
Testing vias and contacts in an integrated circuit
- Patent number 6,784,685
- Issue date Aug 31, 2004
- Xilinx, Inc.
- Tai-An Chao
- G01 - MEASURING TESTING
Information Patent Grant
Testing vias and contacts in integrated circuit fabrication
- Patent number 6,503,765
- Issue date Jan 7, 2003
- Xilinx, Inc.
- Tai-An Chao
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Testing vias and contacts in integrated circuit
- Publication number 20040257105
- Publication date Dec 23, 2004
- Xilinx, Inc.
- Tai-An Chao
- G01 - MEASURING TESTING
Information Patent Application
Testing vias and contacts in integrated circuit fabrication
- Publication number 20030025516
- Publication date Feb 6, 2003
- Xilinx, Inc.
- Tai-An Chao
- G01 - MEASURING TESTING