ShiJie Wen

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Sunnyvale, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Telemetry-based model driven manufacturing test methodology
- Patent number 12,164,400
- Issue date Dec 10, 2024
- Cisco Technology, Inc.
- ShiJie Wen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Stress-testing electrical components using telemetry modeling
- Patent number 12,038,479
- Issue date Jul 16, 2024
- Cisco Technology, Inc.
- James Edwin Turman
- G01 - MEASURING TESTING
Information Patent Grant
Masks that selectively attentuate radiation for inspection of print...
- Patent number 9,869,643
- Issue date Jan 16, 2018
- Cisco Technology, Inc.
- ShiJie Wen
- G01 - MEASURING TESTING
Information Patent Grant
Techniques for embedded memory self repair
- Patent number 8,689,081
- Issue date Apr 1, 2014
- Cisco Technology, Inc.
- Andy Yu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Soft error robust low power latch device layout techniques
- Patent number 8,547,155
- Issue date Oct 1, 2013
- Cisco Technology, Inc.
- John C. Holst
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
STRESS-TESTING ELECTRICAL COMPONENTS USING TELEMETRY MODELING
- Publication number 20240085477
- Publication date Mar 14, 2024
- Cisco Technology, Inc.
- James Edwin Turman
- G01 - MEASURING TESTING
Information Patent Application
TELEMETRY-BASED MODEL DRIVEN MANUFACTURING TEST METHODOLOGY
- Publication number 20230076130
- Publication date Mar 9, 2023
- Cisco Technology, Inc.
- ShiJie Wen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MASKS THAT SELECTIVELY ATTENTUATE RADIATION FOR INSPECTION OF PRINT...
- Publication number 20150212217
- Publication date Jul 30, 2015
- Cisco Technology, Inc.
- ShiJie WEN
- G01 - MEASURING TESTING
Information Patent Application
TECHNIQUES FOR EMBEDDED MEMORY SELF REPAIR
- Publication number 20130139033
- Publication date May 30, 2013
- Cisco Technology, Inc.
- Andy Yu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Soft Error Robust Low Power Latch Device Layout Techniques
- Publication number 20130049835
- Publication date Feb 28, 2013
- Cisco Technology, Inc.
- John C. Holst
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Crack detection in a semiconductor die and package
- Publication number 20120032693
- Publication date Feb 9, 2012
- Cisco Technology, Inc.
- Jie Xue
- G01 - MEASURING TESTING