Shikhar Makkar

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Palwal, IN

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Patents Grantslast 30 patents

Information Patent Grant
Signal toggling detection and correction circuit
- Patent number 11,686,769
- Issue date Jun 27, 2023
- NXP B.V.
- Shikhar Makkar
- G01 - MEASURING TESTING
Information Patent Grant
Data retention during structural testing of system-on-chtps
- Patent number 11,422,187
- Issue date Aug 23, 2022
- NXP B.V.
- Shikhar Makkar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Register for at-speed scan testing
- Patent number 10,948,538
- Issue date Mar 16, 2021
- NXP USA, INC.
- Shikhar Makkar
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SCAN WRAPPER CIRCUIT AND WRAPPER CELLS
- Publication number 20240320409
- Publication date Sep 26, 2024
- NXP B.V.
- Shikhar Makkar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR CONTROLLING AT-SPEED TESTING OF INTEGRATED CI...
- Publication number 20240295602
- Publication date Sep 5, 2024
- NXP B.V.
- Chandan Gupta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SIGNAL TOGGLING DETECTION AND CORRECTION CIRCUIT
- Publication number 20230213580
- Publication date Jul 6, 2023
- NXP B.V.
- Shikhar Makkar
- G01 - MEASURING TESTING
Information Patent Application
REGISTER FOR AT-SPEED SCAN TESTING
- Publication number 20200386808
- Publication date Dec 10, 2020
- NXP USA, Inc.
- Shikhar Makkar
- G01 - MEASURING TESTING