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Kawasaki, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Nuclear magnetic resonance imaging method and apparatus
Patent number
5,014,007
Issue date
May 7, 1991
Hitachi, Ltd.
Koichi Sano
G01 - MEASURING TESTING
Information
Patent Grant
Nuclear magnetic resonance imaging method and apparatus
Patent number
4,870,362
Issue date
Sep 26, 1989
Hitachi, Ltd.
Koichi Sano
G01 - MEASURING TESTING
Information
Patent Grant
Unsharp masking for image enhancement
Patent number
4,794,531
Issue date
Dec 27, 1988
Hitachi, Ltd.
Koichi Morishita
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Nuclear magnetic resonance imaging method
Patent number
4,736,160
Issue date
Apr 5, 1988
Hitachi, Ltd.
Koichi Sano
G01 - MEASURING TESTING
Information
Patent Grant
Sample surface structure measuring method
Patent number
4,733,074
Issue date
Mar 22, 1988
Hitachi, Ltd.
Makoto Kato
G01 - MEASURING TESTING
Information
Patent Grant
System of automatically measuring sectional shape
Patent number
4,725,730
Issue date
Feb 16, 1988
Hitachi, Ltd.
Makoto Kato
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for high resolution nuclear magnetic resonance...
Patent number
4,724,387
Issue date
Feb 9, 1988
Hitachi, Ltd.
Koichi Sano
G01 - MEASURING TESTING
Information
Patent Grant
Image correction processing method and apparatus
Patent number
4,682,300
Issue date
Jul 21, 1987
Hitachi, Ltd.
Youichi Seto
G01 - MEASURING TESTING
Information
Patent Grant
Nuclear magnetic resonance imaging apparatus
Patent number
4,644,278
Issue date
Feb 17, 1987
Hitachi, Ltd.
Koichi Sano
G01 - MEASURING TESTING
Information
Patent Grant
Image registration method
Patent number
4,644,582
Issue date
Feb 17, 1987
Hitachi, Ltd.
Koichi Morishita
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of reconstructing synthetic aperture radar image
Patent number
4,616,227
Issue date
Oct 7, 1986
Hitachi, Ltd.
Koichi Homma
G01 - MEASURING TESTING
Information
Patent Grant
Imaging region-of-interest in medical NMR observation
Patent number
4,607,222
Issue date
Aug 19, 1986
Hitachi, Ltd.
Tetsuo Yokoyama
G01 - MEASURING TESTING