SHIMON KOREN

Person

HAIFA, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor edge and bevel inspection tool system
- Patent number 11,927,545
- Issue date Mar 12, 2024
- Camtek Ltd.
- Carmel Yehuda Drillman
- G01 - MEASURING TESTING
Information Patent Grant
Objective lens
- Patent number 10,598,607
- Issue date Mar 24, 2020
- Camtek Ltd.
- Zehava Ben Ezer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Continuous light inspection
- Patent number 10,497,092
- Issue date Dec 3, 2019
- Camtek Ltd.
- Shimon Koren
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Aperture stop
- Patent number 10,222,517
- Issue date Mar 5, 2019
- CAMTEK LTD.
- Tomer Gilad
- G02 - OPTICS
Information Patent Grant
System for inspecting a backside of a wafer
- Patent number 10,215,707
- Issue date Feb 26, 2019
- CAMTEK LTD.
- Zehava Ben Ezer
- G01 - MEASURING TESTING
Information Patent Grant
High throughput triangulation system
- Patent number 9,759,555
- Issue date Sep 12, 2017
- Camtek Ltd.
- Shimon Koren
- G01 - MEASURING TESTING
Information Patent Grant
High throughput and low cost height triangulation system and method
- Patent number 9,756,313
- Issue date Sep 5, 2017
- Camtek Ltd.
- Shimon Koren
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System and a method for automatic recipe validation and selection
- Patent number 9,418,413
- Issue date Aug 16, 2016
- Camtek Ltd.
- Shimon Koren
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring bumps based on phase and amplitude...
- Patent number 9,147,102
- Issue date Sep 29, 2015
- Camtek Ltd.
- Shimon Koren
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for wafer registration
- Patent number 8,731,274
- Issue date May 20, 2014
- Camtek Ltd.
- Eldad Langmans
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection recipe generation and inspection based on an inspection...
- Patent number 8,699,784
- Issue date Apr 15, 2014
- Camtek Ltd.
- Eldad Langmatz
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION SYSTEM FOR EDGE AND BEVEL INSPECTION OF SEMICONDUCTOR ST...
- Publication number 20240355083
- Publication date Oct 24, 2024
- CAMTEK LTD
- Carmel Yehuda DRILLMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OBJECTIVE LENS
- Publication number 20190033234
- Publication date Jan 31, 2019
- CAMTEK LTD
- Zehava Ben Ezer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APERTURE STOP
- Publication number 20170261654
- Publication date Sep 14, 2017
- Tomer Gilad
- G02 - OPTICS
Information Patent Application
CONTINUOUS LIGHT INSPECTION
- Publication number 20170150104
- Publication date May 25, 2017
- CAMTEK LTD
- SHIMON KOREN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM FOR INSPECTING A BACKSIDE OF A WAFER
- Publication number 20170010220
- Publication date Jan 12, 2017
- Camtek LTD.
- Zehava Ben Ezer
- G01 - MEASURING TESTING
Information Patent Application
High throughput triangulation system
- Publication number 20170010093
- Publication date Jan 12, 2017
- Camtek LTD.
- Shimon Koren
- G01 - MEASURING TESTING
Information Patent Application
APERTURE STOP
- Publication number 20160366315
- Publication date Dec 15, 2016
- Camtek LTD.
- Tomer Gilad
- G02 - OPTICS
Information Patent Application
SYSTEM AND A METHOD FOR AUTOMATIC RECIPE VALIDATION AND SELECTION
- Publication number 20160321792
- Publication date Nov 3, 2016
- Camtek LTD.
- Shimon Koren
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIGH THROUGHPUT AND LOW COST HEIGHT TRIANGULATION SYSTEM AND METHOD
- Publication number 20140362208
- Publication date Dec 11, 2014
- CAMTEK LTD
- Shimon Koren
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR MEASURING BUMPS BASED ON PHASE AND AMPLITUDE...
- Publication number 20130170712
- Publication date Jul 4, 2013
- CAMTEK LTD
- Shimon Koren
- G02 - OPTICS
Information Patent Application
METHOD AND SYSTEM FOR WAFER REGISTRATION
- Publication number 20120195490
- Publication date Aug 2, 2012
- Eldad Langmans
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION RECIPE GENERATION AND INSPECTION BASED ON AN INSPECTION...
- Publication number 20120057773
- Publication date Mar 8, 2012
- CAMTEK LTD
- ELDAD LANGMATZ
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEPTH MEASUREMENTS OF NARROW HOLES
- Publication number 20110184694
- Publication date Jul 28, 2011
- CAMTEK LTD
- Ilana Grimberg
- G01 - MEASURING TESTING

SHIMON KOREN

Person

Patents Grantslast 30 patents

Semiconductor edge and bevel inspection tool system

Objective lens

Continuous light inspection

Aperture stop

System for inspecting a backside of a wafer

High throughput triangulation system

High throughput and low cost height triangulation system and method

System and a method for automatic recipe validation and selection

Method and system for measuring bumps based on phase and amplitude...

Method and system for wafer registration

Inspection recipe generation and inspection based on an inspection...

Patents Applicationslast 30 patents

INSPECTION SYSTEM FOR EDGE AND BEVEL INSPECTION OF SEMICONDUCTOR ST...

OBJECTIVE LENS

APERTURE STOP

CONTINUOUS LIGHT INSPECTION

SYSTEM FOR INSPECTING A BACKSIDE OF A WAFER

High throughput triangulation system

APERTURE STOP

SYSTEM AND A METHOD FOR AUTOMATIC RECIPE VALIDATION AND SELECTION

HIGH THROUGHPUT AND LOW COST HEIGHT TRIANGULATION SYSTEM AND METHOD

METHOD AND SYSTEM FOR MEASURING BUMPS BASED ON PHASE AND AMPLITUDE...

METHOD AND SYSTEM FOR WAFER REGISTRATION

INSPECTION RECIPE GENERATION AND INSPECTION BASED ON AN INSPECTION...

DEPTH MEASUREMENTS OF NARROW HOLES