Shimon LEVI

Person

Tivon, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Method, system and computer program product for 3D-NAND CDSEM metro...
- Patent number 11,651,509
- Issue date May 16, 2023
- Applied Materials Israel Ltd.
- Roman Kris
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measuring height difference in patterns on semiconductor wafers
- Patent number 11,301,983
- Issue date Apr 12, 2022
- Applied Materials Israel Ltd.
- Ishai Schwarzband
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measuring height difference in patterns on semiconductor wafers
- Patent number 10,748,272
- Issue date Aug 18, 2020
- Applied Materials Israel Ltd.
- Ishai Schwarzband
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for monitoring nanometric structures
- Patent number 10,731,979
- Issue date Aug 4, 2020
- Applied Materials Israel Ltd.
- Shimon Levi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Technique for measuring overlay between layers of a multilayer stru...
- Patent number 10,354,376
- Issue date Jul 16, 2019
- Applied Materials Israel Ltd.
- Yakov Weinberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Technique for measuring overlay between layers of a multilayer stru...
- Patent number 9,916,652
- Issue date Mar 13, 2018
- Applied Materials Israel Ltd.
- Yakov Weinberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Technique for measuring overlay between layers of a multilayer stru...
- Patent number 9,530,199
- Issue date Dec 27, 2016
- Applied Materials Israel Ltd.
- Yakov Weinberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System, method and computer readable medium for detecting edges of...
- Patent number 9,165,376
- Issue date Oct 20, 2015
- Applied Materials Israel Ltd.
- Ishai Schwartzband
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High throughput across-wafer-variation mapping
- Patent number 7,990,546
- Issue date Aug 2, 2011
- Applied Materials Israel, Ltd.
- Jeong Ho Yeo
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD, SYSTEM AND COMPUTER PROGRAM PRODUCT FOR 3D-NAND CDSEM METRO...
- Publication number 20210383529
- Publication date Dec 9, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Roman KRIS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASURING HEIGHT DIFFERENCE IN PATTERNS ON SEMICONDUCTOR WAFERS
- Publication number 20200380668
- Publication date Dec 3, 2020
- APPLIED MATERIALS ISRAEL LTD.
- Ishai SCHWARZBAND
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR MONITORING NANOMETRIC STRUCTURES
- Publication number 20190219390
- Publication date Jul 18, 2019
- APPLIED MATERIALS ISRAEL, LTD.
- Shimon LEVI
- B82 - NANO-TECHNOLOGY
Information Patent Application
MEASURING HEIGHT DIFFERENCE IN PATTERNS ON SEMICONDUCTOR WAFERS
- Publication number 20180336675
- Publication date Nov 22, 2018
- APPLIED MATERIALS ISRAEL LTD.
- Ishai SCHWARZBAND
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TECHNIQUE FOR MEASURING OVERLAY BETWEEN LAYERS OF A MULTILAYER STRU...
- Publication number 20180268539
- Publication date Sep 20, 2018
- APPLIED MATERIALS ISRAEL LTD.
- Yakov WEINBERG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TECHNIQUE FOR MEASURING OVERLAY BETWEEN LAYERS OF A MULTILAYER STRU...
- Publication number 20170243343
- Publication date Aug 24, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Yakov WEINBERG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TECHNIQUE FOR MEASURING OVERLAY BETWEEN LAYERS OF A MULTILAYER STRU...
- Publication number 20170018066
- Publication date Jan 19, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Yakov WEINBERG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM, METHOD AND COMPUTER READABLE MEDIUM FOR DETECTING EDGES OF...
- Publication number 20140270470
- Publication date Sep 18, 2014
- APPLIED MATERIALS ISRAEL, LTD.
- Ishai Schwartzband
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIGH THROUGHPUT ACROSS-WAFER-VARIATION MAPPING
- Publication number 20090021749
- Publication date Jan 22, 2009
- Jeong Ho Yeo
- G01 - MEASURING TESTING

Shimon LEVI

Person

Patents Grantslast 30 patents

Method, system and computer program product for 3D-NAND CDSEM metro...

Measuring height difference in patterns on semiconductor wafers

Measuring height difference in patterns on semiconductor wafers

Method for monitoring nanometric structures

Technique for measuring overlay between layers of a multilayer stru...

Technique for measuring overlay between layers of a multilayer stru...

Technique for measuring overlay between layers of a multilayer stru...

System, method and computer readable medium for detecting edges of...

High throughput across-wafer-variation mapping

Patents Applicationslast 30 patents

METHOD, SYSTEM AND COMPUTER PROGRAM PRODUCT FOR 3D-NAND CDSEM METRO...

MEASURING HEIGHT DIFFERENCE IN PATTERNS ON SEMICONDUCTOR WAFERS

METHOD FOR MONITORING NANOMETRIC STRUCTURES

MEASURING HEIGHT DIFFERENCE IN PATTERNS ON SEMICONDUCTOR WAFERS

TECHNIQUE FOR MEASURING OVERLAY BETWEEN LAYERS OF A MULTILAYER STRU...

TECHNIQUE FOR MEASURING OVERLAY BETWEEN LAYERS OF A MULTILAYER STRU...

TECHNIQUE FOR MEASURING OVERLAY BETWEEN LAYERS OF A MULTILAYER STRU...

SYSTEM, METHOD AND COMPUTER READABLE MEDIUM FOR DETECTING EDGES OF...

HIGH THROUGHPUT ACROSS-WAFER-VARIATION MAPPING