Shimshon Ben-Dov

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Yokneam, IL

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Patents Grantslast 30 patents

Information Patent Grant
Wavelength-dependent surface contour measurement system and method
- Patent number 6,636,310
- Issue date Oct 21, 2003
- Metroptic Technologies, Ltd.
- Shimshon Ben-Dov
- G01 - MEASURING TESTING
Information Patent Grant
Stereoscopic sensor
- Patent number 6,163,640
- Issue date Dec 19, 2000
- Metroptic Technologies, Inc.
- Shimshon Ben-Dov
- G02 - OPTICS