Shin-ichi Wakana

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Automatic immunological measuring system
- Patent number 5,482,839
- Issue date Jan 9, 1996
- Yoshihiro Ashihara
- G01 - MEASURING TESTING
Information Patent Grant
Method of immunoassay measurement
- Patent number 5,290,708
- Issue date Mar 1, 1994
- Fujirebio Inc.
- Yoshihiro Ashihara
- G01 - MEASURING TESTING
Information Patent Grant
Automatic immunological measuring system
- Patent number 5,158,895
- Issue date Oct 27, 1992
- Fujirebio Inc.
- Yoshihiro Ashihara
- G01 - MEASURING TESTING