Shin Imamura

Person

Kokubunji, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Device for detecting charged particles or radiation
- Patent number 12,339,407
- Issue date Jun 24, 2025
- HITACHI HIGH-TECH CORPORATION
- Laila Ambar Sari
- G01 - MEASURING TESTING
Information Patent Grant
Scintillator, measuring device, mass spectrometer, and electron mic...
- Patent number 12,072,454
- Issue date Aug 27, 2024
- HITACHI HIGH-TECH CORPORATION
- Shin Imamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion detector
- Patent number 11,955,327
- Issue date Apr 9, 2024
- HITACHI HIGH-TECH CORPORATION
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Light source and biochemical analyzer
- Patent number 11,906,420
- Issue date Feb 20, 2024
- HITACHI HIGH-TECH CORPORATION
- Yoshifumi Sekiguchi
- G01 - MEASURING TESTING
Information Patent Grant
Scintillator for charged particle beam apparatus and charged partic...
- Patent number 11,846,736
- Issue date Dec 19, 2023
- HITACHI HIGH-TECH CORPORATION
- Eri Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Broadband light source device and biochemical analyzing device
- Patent number 11,754,493
- Issue date Sep 12, 2023
- HITACHI HIGH-TECH CORPORATION
- Tomoto Kawamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,694,873
- Issue date Jul 4, 2023
- HITACHI HIGH-TECH CORPORATION
- Yoshifumi Sekiguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,515,120
- Issue date Nov 29, 2022
- HITACHI HIGH-TECH CORPORATION
- Yoshifumi Sekiguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated analysis device
- Patent number 11,506,534
- Issue date Nov 22, 2022
- HITACHI HIGH-TECH CORPORATION
- Takeshi Ishida
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device
- Patent number 11,348,757
- Issue date May 31, 2022
- HITACHI HIGH-TECH CORPORATION
- Shuhei Yabu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle detector including a light-emitting section having...
- Patent number 11,062,892
- Issue date Jul 13, 2021
- HITACHI HIGH-TECH CORPORATION
- Shin Imamura
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle detector and charged particle beam apparatus
- Patent number 10,984,979
- Issue date Apr 20, 2021
- HITACHI HIGH-TECH CORPORATION
- Shin Imamura
- G01 - MEASURING TESTING
Information Patent Grant
Light guide, detector having light guide, and charged particle beam...
- Patent number 10,679,821
- Issue date Jun 9, 2020
- HITACHI HIGH-TECH CORPORATION
- Yoshifumi Sekiguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Light guide, detector having light guide, and charged particle beam...
- Patent number 10,593,512
- Issue date Mar 17, 2020
- Hitachi High-Technologies Corporation
- Yoshifumi Sekiguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope and electron beam detector
- Patent number 9,355,815
- Issue date May 31, 2016
- Hitachi High-Technologies Corporation
- Shin Imamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fluorescent lamp and image display apparatus
- Patent number 8,803,423
- Issue date Aug 12, 2014
- Hitachi, Ltd.
- Masakazu Sagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Liquid crystal display device with the mixture of the plural kinds...
- Patent number 8,183,758
- Issue date May 22, 2012
- Hitachi Displays, Ltd.
- Kenji Okishiro
- G02 - OPTICS
Information Patent Grant
Plasma display device
- Patent number 8,115,388
- Issue date Feb 14, 2012
- Hitachi, Ltd.
- Hirotaka Sakuma
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
Imaging device with specific phosphor
- Patent number 7,656,081
- Issue date Feb 2, 2010
- Hitachi Displays, Ltd.
- Shin Imamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Light source and display using the same
- Patent number 7,005,197
- Issue date Feb 28, 2006
- Hitachi, Ltd.
- Masatoshi Shiiki
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Image-display device
- Patent number 6,808,829
- Issue date Oct 26, 2004
- Hitachi, Ltd.
- Masaaki Komatsu
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
Display
- Patent number 6,791,253
- Issue date Sep 14, 2004
- Hitachi, Ltd.
- Masaaki Komatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
White light source and display apparatus using the same
- Patent number 6,762,551
- Issue date Jul 13, 2004
- Hitachi, Ltd.
- Masatoshi Shiiki
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Phosphor and imaging device using the same
- Patent number 6,753,099
- Issue date Jun 22, 2004
- Hitachi, Ltd.
- Shin Imamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Green-emitting phosphor and image display device using the same
- Patent number 6,696,782
- Issue date Feb 24, 2004
- Hitachi, Ltd.
- Shin Imamura
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PHOSPHOR, LIGHT SOURCE USING SAME, BIOCHEMICAL ANALYSIS DEVICE, AND...
- Publication number 20230374377
- Publication date Nov 23, 2023
- HITACHI HIGH-TECH CORPORATION
- Masaaki KOMATSU
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
DEVICE FOR DETECTING CHARGED PARTICLES OR RADIATION
- Publication number 20230266485
- Publication date Aug 24, 2023
- Hitachi High-Tech Corporation
- Laila Ambar SARI
- G01 - MEASURING TESTING
Information Patent Application
SCINTILLATOR AND CHARGED PARTICLE RADIATION APPARATUS
- Publication number 20230184704
- Publication date Jun 15, 2023
- HITACHI HIGH-TECH CORPORATION
- Eri TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE DETECTOR, CHARGED PARTICLE RAY DEVICE, RADIATION D...
- Publication number 20230050424
- Publication date Feb 16, 2023
- HITACHI HIGH-TECH CORPORATION
- Takumu IWANAKA
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20230030651
- Publication date Feb 2, 2023
- HITACHI HIGH-TECH CORPORATION
- Yoshifumi SEKIGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCINTILLATOR, MEASURING DEVICE, MASS SPECTROMETER, AND ELECTRON MIC...
- Publication number 20220413169
- Publication date Dec 29, 2022
- HITACHI HIGH-TECH CORPORATION
- Shin IMAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATIC ANALYSIS DEVICE
- Publication number 20220397581
- Publication date Dec 15, 2022
- HITACHI HIGH-TECH CORPORATION
- Takahiro ANDO
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
SCINTILLATOR FOR CHARGED PARTICLE BEAM APPARATUS AND CHARGED PARTIC...
- Publication number 20220244412
- Publication date Aug 4, 2022
- HITACHI HIGH-TECH CORPORATION
- Eri TAKAHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Light Source and Biochemical Analyzer
- Publication number 20220214266
- Publication date Jul 7, 2022
- Hitachi High-Tech Corporation
- Yoshifumi SEKIGUCHI
- G01 - MEASURING TESTING
Information Patent Application
Ion Detector
- Publication number 20220181138
- Publication date Jun 9, 2022
- Hitachi High-Tech Corporation
- Kiyomi YOSHINARI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BROADBAND LIGHT SOURCE DEVICE AND BIOCHEMICAL ANALYZING DEVICE
- Publication number 20210381954
- Publication date Dec 9, 2021
- HITACHI HIGH-TECH CORPORATION
- Tomoto KAWAMURA
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam Device
- Publication number 20210272768
- Publication date Sep 2, 2021
- Hitachi High-Tech Corporation
- Shuhei YABU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FLUORESCENT BODY, LIGHT SOURCE, AND BIOCHEMICAL ANALYZER
- Publication number 20210253949
- Publication date Aug 19, 2021
- HITACHI HIGH-TECH CORPORATION
- Masaaki KOMATSU
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20210183614
- Publication date Jun 17, 2021
- HITACHI HIGH-TECH CORPORATION
- Yoshifumi SEKIGUCHI
- G01 - MEASURING TESTING
Information Patent Application
GLASS COMPOSITION, NEUTRON-ABSORBING MATERIAL COMPRISING SAME, METH...
- Publication number 20200239355
- Publication date Jul 30, 2020
- Hitachi, Ltd
- Takashi NAITO
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Light Guide, Detector Having Light Guide, and Charged Particle Beam...
- Publication number 20200203120
- Publication date Jun 25, 2020
- Hitachi High-Technologies Corporation
- Yoshifumi SEKIGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE DETECTOR AND CHARGED PARTICLE BEAM APPARATUS
- Publication number 20190355549
- Publication date Nov 21, 2019
- Hitachi High-Technologies Corporation
- Shin IMAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATED ANALYSIS DEVICE
- Publication number 20190316963
- Publication date Oct 17, 2019
- Hitachi High-Technologies Corporation
- Takeshi ISHIDA
- G01 - MEASURING TESTING
Information Patent Application
Light Guide, Detector Having Light Guide, and Charged Particle Beam...
- Publication number 20190115186
- Publication date Apr 18, 2019
- Hitachi High-Technologies Corporation
- Yoshifumi SEKIGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE DETECTOR, CHARGED PARTICLE BEAM DEVICE, AND MASS S...
- Publication number 20190027351
- Publication date Jan 24, 2019
- Hitachi High-Technologies Corporation
- Shin IMAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE AND ELECTRON BEAM DETECTOR
- Publication number 20150214002
- Publication date Jul 30, 2015
- Hitachi High-Technologies Corporation
- Shin Imamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAVELENGTH CONVERSION TYPE SEALING MATERIAL SHEET AND SOLAR BATTERY...
- Publication number 20130340808
- Publication date Dec 26, 2013
- Masaaki Komatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FLUORESCENT LAMP AND IMAGE DISPLAY APPARATUS
- Publication number 20120200613
- Publication date Aug 9, 2012
- Masakazu Sagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BACKLIGHT AND LIQUID CRYSTAL DISPLAY DEVICE
- Publication number 20110063819
- Publication date Mar 17, 2011
- Kenichi YAMAMOTO
- G02 - OPTICS
Information Patent Application
PLASMA DISPLAY PANEL
- Publication number 20100096975
- Publication date Apr 22, 2010
- HITACHI CONSUMER ELECTRONICS CO., LTD.
- Shin IMAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISPLAY DEVICE AND PLASMA DISPLAY PANEL
- Publication number 20090230836
- Publication date Sep 17, 2009
- Shin Imamura
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
PLASMA DISPLAY DEVICE
- Publication number 20090224668
- Publication date Sep 10, 2009
- Hirotaka Sakuma
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
IMAGE DISPLAY DEVICE
- Publication number 20090115332
- Publication date May 7, 2009
- Shin Imamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FLUORESCENT LAMP AND IMAGING DEVICE USIGN THE SAME
- Publication number 20080218664
- Publication date Sep 11, 2008
- Shin IMAMURA
- G02 - OPTICS
Information Patent Application
IMAGING DEVICE
- Publication number 20080160218
- Publication date Jul 3, 2008
- Shin Imamura
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...

Shin Imamura

Person

Patents Grantslast 30 patents

Device for detecting charged particles or radiation

Scintillator, measuring device, mass spectrometer, and electron mic...

Ion detector

Light source and biochemical analyzer

Scintillator for charged particle beam apparatus and charged partic...

Broadband light source device and biochemical analyzing device

Charged particle beam apparatus

Charged particle beam apparatus

Automated analysis device

Charged particle beam device

Charged particle detector including a light-emitting section having...

Charged particle detector and charged particle beam apparatus

Light guide, detector having light guide, and charged particle beam...

Light guide, detector having light guide, and charged particle beam...

Electron microscope and electron beam detector

Fluorescent lamp and image display apparatus

Liquid crystal display device with the mixture of the plural kinds...

Plasma display device

Imaging device with specific phosphor

Light source and display using the same

Image-display device

Display

White light source and display apparatus using the same

Phosphor and imaging device using the same

Green-emitting phosphor and image display device using the same

Patents Applicationslast 30 patents

PHOSPHOR, LIGHT SOURCE USING SAME, BIOCHEMICAL ANALYSIS DEVICE, AND...

DEVICE FOR DETECTING CHARGED PARTICLES OR RADIATION

SCINTILLATOR AND CHARGED PARTICLE RADIATION APPARATUS

CHARGED PARTICLE DETECTOR, CHARGED PARTICLE RAY DEVICE, RADIATION D...

CHARGED PARTICLE BEAM APPARATUS

SCINTILLATOR, MEASURING DEVICE, MASS SPECTROMETER, AND ELECTRON MIC...

AUTOMATIC ANALYSIS DEVICE

SCINTILLATOR FOR CHARGED PARTICLE BEAM APPARATUS AND CHARGED PARTIC...

Light Source and Biochemical Analyzer

Ion Detector

BROADBAND LIGHT SOURCE DEVICE AND BIOCHEMICAL ANALYZING DEVICE

Charged Particle Beam Device

FLUORESCENT BODY, LIGHT SOURCE, AND BIOCHEMICAL ANALYZER

CHARGED PARTICLE BEAM APPARATUS

GLASS COMPOSITION, NEUTRON-ABSORBING MATERIAL COMPRISING SAME, METH...

Light Guide, Detector Having Light Guide, and Charged Particle Beam...

CHARGED PARTICLE DETECTOR AND CHARGED PARTICLE BEAM APPARATUS

AUTOMATED ANALYSIS DEVICE

Light Guide, Detector Having Light Guide, and Charged Particle Beam...

CHARGED PARTICLE DETECTOR, CHARGED PARTICLE BEAM DEVICE, AND MASS S...

ELECTRON MICROSCOPE AND ELECTRON BEAM DETECTOR

WAVELENGTH CONVERSION TYPE SEALING MATERIAL SHEET AND SOLAR BATTERY...

FLUORESCENT LAMP AND IMAGE DISPLAY APPARATUS

BACKLIGHT AND LIQUID CRYSTAL DISPLAY DEVICE

PLASMA DISPLAY PANEL

DISPLAY DEVICE AND PLASMA DISPLAY PANEL

PLASMA DISPLAY DEVICE

IMAGE DISPLAY DEVICE

FLUORESCENT LAMP AND IMAGING DEVICE USIGN THE SAME

IMAGING DEVICE