Shin-Juh CHEN

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Andover, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for simultaneous high-sensitivity measurement of...
- Patent number 12,228,501
- Issue date Feb 18, 2025
- Heath Consultants Incorporated
- Michael B. Frish
- G01 - MEASURING TESTING
Information Patent Grant
Multiple contaminants natural gas analyser
- Patent number 11,293,862
- Issue date Apr 5, 2022
- GALVANIC APPLIED SCIENCES INC.
- David D. Haydt
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR SIMULTANEOUS HIGH-SENSITIVITY MEASUREMENT OF...
- Publication number 20250189443
- Publication date Jun 12, 2025
- HEATH CONSULTANTS INCORPORATED
- MICHAEL B. FRISH
- G01 - MEASURING TESTING
Information Patent Application
COMPACT STANDOFF QUANTIFIED GAS PLUME VISUALIZATION SYSTEM
- Publication number 20240344972
- Publication date Oct 17, 2024
- Physical Sciences Inc.
- SHIN-JUH CHEN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR SIMULTANEOUS HIGH-SENSITIVITY MEASUREMENT OF...
- Publication number 20230107797
- Publication date Apr 6, 2023
- HEATH CONSULTANTS INCORPORATED
- MICHAEL B. FRISH
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE CONTAMINANTS NATURAL GAS ANALYSER
- Publication number 20210285873
- Publication date Sep 16, 2021
- Galvanic Applied Sciences Inc.
- David D. HAYDT
- G01 - MEASURING TESTING