Shin Koyama

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Electronic tag writing system and method for same
- Patent number 11,334,727
- Issue date May 17, 2022
- Daio Paper Corporation
- Taro Ikawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device including a plurality of nitride semiconductor...
- Patent number 10,658,469
- Issue date May 19, 2020
- Renesas Electronics Corporation
- Toshihiro Iizuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-performance MOS transistor of LDD structure having a gate insu...
- Patent number 6,794,258
- Issue date Sep 21, 2004
- NEC Electronics Corporation
- Mariko Makabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-performance MOS transistor of LDD structure having a gate insu...
- Patent number 6,614,081
- Issue date Sep 2, 2003
- NEC Electronics Corporation
- Mariko Makabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor apparatus including CMOS circuits and method for fabr...
- Patent number 6,603,179
- Issue date Aug 5, 2003
- NEC Electronics Corporation
- Koichi Ando
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ELECTRONIC TAG WRITING SYSTEM AND METHOD FOR SAME
- Publication number 20220188530
- Publication date Jun 16, 2022
- Daio Paper Corporation
- Taro IKAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRONIC TAG WRITING SYSTEM AND METHOD FOR SAME
- Publication number 20210081621
- Publication date Mar 18, 2021
- DAIO PAPER CORPORATION
- Taro Ikawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
- Publication number 20170047409
- Publication date Feb 16, 2017
- RENESAS ELECTRONICS CORPORATION
- Toshihiro IIZUKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Pattern for evaluating electric characteristics, method for evaluat...
- Publication number 20080038851
- Publication date Feb 14, 2008
- NEC Electronics Corporation
- Shin Koyama
- G01 - MEASURING TESTING
Information Patent Application
High-performance MOS transistor of LDD structure having a gate insu...
- Publication number 20040026752
- Publication date Feb 12, 2004
- NEC Electronics Corporation
- Mariko Makabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor appratus including CMOS circuits and method for fabri...
- Publication number 20020063295
- Publication date May 30, 2002
- NEC Corporation
- Koichi Ando
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High-performance MOS transistor of LDD structure and manufacturing...
- Publication number 20010028086
- Publication date Oct 11, 2001
- Mariko Makabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for fabricating semiconductor device
- Publication number 20010016388
- Publication date Aug 23, 2001
- Shin Koyama
- H01 - BASIC ELECTRIC ELEMENTS

Shin Koyama

Person

Patents Grantslast 30 patents

Electronic tag writing system and method for same

Semiconductor device including a plurality of nitride semiconductor...

High-performance MOS transistor of LDD structure having a gate insu...

High-performance MOS transistor of LDD structure having a gate insu...

Semiconductor apparatus including CMOS circuits and method for fabr...

Patents Applicationslast 30 patents

ELECTRONIC TAG WRITING SYSTEM AND METHOD FOR SAME

ELECTRONIC TAG WRITING SYSTEM AND METHOD FOR SAME

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE

Pattern for evaluating electric characteristics, method for evaluat...

High-performance MOS transistor of LDD structure having a gate insu...

Semiconductor appratus including CMOS circuits and method for fabri...

High-performance MOS transistor of LDD structure and manufacturing...

Method for fabricating semiconductor device