SHIN-LAN KAO

Person

  • ZHUBEI, TW

Patents Grantslast 30 patents

  • Information Patent Grant

    Probe module

    • Patent number 9,759,746
    • Issue date Sep 12, 2017
    • MPI Corporation
    • Wei-Cheng Ku
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    CALIBRATION PLATE

    • Publication number 20150168531
    • Publication date Jun 18, 2015
    • MPI CORPORATION
    • WEI-CHENG KU
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE MODULE

    • Publication number 20150168447
    • Publication date Jun 18, 2015
    • MPI CORPORATION
    • WEI-CHENG KU
    • G01 - MEASURING TESTING