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Shin MASUDA
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Miyagi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Laser beam output apparatus
Patent number
11,829,048
Issue date
Nov 28, 2023
Advantest Corporation
Takao Sakurai
G02 - OPTICS
Information
Patent Grant
Test apparatus of antenna array
Patent number
11,789,055
Issue date
Oct 17, 2023
Advantest Corporation
Koji Asami
G01 - MEASURING TESTING
Information
Patent Grant
Optical testing apparatus
Patent number
11,635,374
Issue date
Apr 25, 2023
Advantest Corporation
Toshihiro Sugawara
G01 - MEASURING TESTING
Information
Patent Grant
Optical device
Patent number
11,500,230
Issue date
Nov 15, 2022
Advantest Corporation
Hideo Hara
G02 - OPTICS
Information
Patent Grant
Test apparatus, test method, calibration device, and calibration me...
Patent number
9,791,512
Issue date
Oct 17, 2017
Advantest Corporation
Shin Masuda
G01 - MEASURING TESTING
Information
Patent Grant
Device interface apparatus, test apparatus, and test method
Patent number
9,246,579
Issue date
Jan 26, 2016
Advantest Corporation
Hideo Hara
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Test apparatus having optical interface and test method
Patent number
8,907,696
Issue date
Dec 9, 2014
Advantest Corporation
Shin Masuda
G01 - MEASURING TESTING
Information
Patent Grant
Test apparatus, test method, and device interface for testing a dev...
Patent number
8,885,157
Issue date
Nov 11, 2014
Advantest Corporation
Shin Masuda
G01 - MEASURING TESTING
Information
Patent Grant
Light source, optical signal generator, and electrical signal gener...
Patent number
8,792,792
Issue date
Jul 29, 2014
Advantest Corporation
Shin Masuda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optical signal output apparatus, electrical signal output apparatus...
Patent number
8,712,252
Issue date
Apr 29, 2014
Advantest Corporation
Shin Masuda
G01 - MEASURING TESTING
Information
Patent Grant
Device interface apparatus and test apparatus
Patent number
8,699,018
Issue date
Apr 15, 2014
Advantest Corporation
Hideo Hara
G01 - MEASURING TESTING
Information
Patent Grant
Test apparatus, test method, and device interface
Patent number
8,659,750
Issue date
Feb 25, 2014
Advantest Corporation
Shin Masuda
G01 - MEASURING TESTING
Information
Patent Grant
Optical device and optical modulation apparatus
Patent number
8,559,777
Issue date
Oct 15, 2013
Advantest Corporation
Hideo Hara
G02 - OPTICS
Information
Patent Grant
Light receiving device, light receiving device manufacturing method...
Patent number
8,279,379
Issue date
Oct 2, 2012
Advantest Corporation
Shin Masuda
G01 - MEASURING TESTING
Information
Patent Grant
Substrate structure and manufacturing method
Patent number
8,224,143
Issue date
Jul 17, 2012
Advantest Corporation
Shin Masuda
G02 - OPTICS
Information
Patent Grant
Laser oscillator
Patent number
7,898,733
Issue date
Mar 1, 2011
Advantest Corporation
Kazunori Shiota
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Laser oscillator
Patent number
7,602,546
Issue date
Oct 13, 2009
Advantest Corporation
Kazunori Shiota
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Wavelength determining device, wavelength meter equipped with the d...
Patent number
7,423,759
Issue date
Sep 9, 2008
Advantest Corporation
Shin Masuda
G01 - MEASURING TESTING
Information
Patent Grant
Temperature stabilizer and oscillating apparatus
Patent number
7,292,116
Issue date
Nov 6, 2007
Advantest Corporation
Shoji Niki
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
Information
Patent Application
TEST APPARATUS OF ANTENNA ARRAY
Publication number
20220326290
Publication date
Oct 13, 2022
Advantest Corporation
Koji ASAMI
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL DEVICE
Publication number
20210294132
Publication date
Sep 23, 2021
Advantest Corporation
Hideo HARA
G02 - OPTICS
Information
Patent Application
OPTICAL TESTING APPARATUS
Publication number
20200355608
Publication date
Nov 12, 2020
Advantest Corporation
Toshihiro SUGAWARA
G01 - MEASURING TESTING
Information
Patent Application
LASER BEAM OUTPUT APPARATUS
Publication number
20200310220
Publication date
Oct 1, 2020
Advantest Corporation
Takao SAKURAI
G02 - OPTICS
Information
Patent Application
TEST APPARATUS, TEST METHOD, CALIBRATION DEVICE, AND CALIBRATION ME...
Publication number
20150253388
Publication date
Sep 10, 2015
Advantest Corporation
Shin MASUDA
G01 - MEASURING TESTING
Information
Patent Application
DEVICE INTERFACE APPARATUS, TEST APPARATUS, AND TEST METHOD
Publication number
20150016817
Publication date
Jan 15, 2015
Advantest Corporation
Hideo HARA
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
OPTICAL DEVICE AND OPTICAL MODULATION APPARATUS
Publication number
20120328227
Publication date
Dec 27, 2012
Advantest Corporation
Hideo HARA
G02 - OPTICS
Information
Patent Application
LIGHT SOURCE, OPTICAL SIGNAL GENERATOR, AND ELECTRICAL SIGNAL GENER...
Publication number
20120269521
Publication date
Oct 25, 2012
Advantest Corporation
Shin Masuda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
OPTICAL SIGNAL OUTPUT APPARATUS, ELECTRICAL SIGNAL OUTPUT APPARATUS...
Publication number
20120177363
Publication date
Jul 12, 2012
Advantest Corporation
Shin MASUDA
G01 - MEASURING TESTING
Information
Patent Application
DEVICE INTERFACE APPARATUS AND TEST APPARATUS
Publication number
20120033208
Publication date
Feb 9, 2012
Advantest Corporation
Hideo HARA
G02 - OPTICS
Information
Patent Application
TEST APPARATUS AND TEST METHOD
Publication number
20110279109
Publication date
Nov 17, 2011
Advantest Corporation
Shin MASUDA
G01 - MEASURING TESTING
Information
Patent Application
TEST APPARATUS, TEST METHOD, AND DEVICE INTERFACE
Publication number
20110279811
Publication date
Nov 17, 2011
Advantest Corporation
Shin MASUDA
G01 - MEASURING TESTING
Information
Patent Application
TEST APPARATUS, TEST METHOD, AND DEVICE INTERFACE
Publication number
20110279812
Publication date
Nov 17, 2011
Advantest Corporation
Shin MASUDA
G02 - OPTICS
Information
Patent Application
PULSE LASER, OPTICAL FREQUENCY STABILIZED LASER, MEASUREMENT METHOD...
Publication number
20110274127
Publication date
Nov 10, 2011
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
Shin MASUDA
G02 - OPTICS
Information
Patent Application
FIBER LASER
Publication number
20110228806
Publication date
Sep 22, 2011
Advantest Corporation
Shin Masuda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SUBSTRATE STRUCTURE AND MANUFACTURING METHOD
Publication number
20110195274
Publication date
Aug 11, 2011
Advantest Corporation
SHIN MASUDA
G02 - OPTICS
Information
Patent Application
LIGHT RECEIVING DEVICE, LIGHT RECEIVING DEVICE MANUFACTURING METHOD...
Publication number
20110090431
Publication date
Apr 21, 2011
Advantest Corporation
Shin MASUDA
G01 - MEASURING TESTING
Information
Patent Application
MANUFACTURING EQUIPMENT AND MANUFACTURING METHOD
Publication number
20110081137
Publication date
Apr 7, 2011
Advantest Corporation
Shin Masuda
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
LASER OSCILLATOR
Publication number
20100067100
Publication date
Mar 18, 2010
Advantest Corporation
Kazunori Shiota
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
OPTICAL PULSE GENERATOR, SEMICONDUCTOR LASER MODULE, AND SEMICONDUC...
Publication number
20080175599
Publication date
Jul 24, 2008
Advantest Corporation
Shin Masuda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Laser oscillator
Publication number
20070242346
Publication date
Oct 18, 2007
Advantest Corporation
Kazunori Shiota
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Wavelength determining device, wavelength meter equipped with the d...
Publication number
20060221344
Publication date
Oct 5, 2006
Advantest Corporation
Shin Masuda
G01 - MEASURING TESTING
Information
Patent Application
Temperature stabilizer and oscillating apparatus
Publication number
20060139116
Publication date
Jun 29, 2006
Advantest Corporation
Shoji Niki
H03 - BASIC ELECTRONIC CIRCUITRY