Shin Nemoto

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Yono, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device testing apparatus and semiconductor device tes...
- Patent number 6,433,294
- Issue date Aug 13, 2002
- Advantest Corporation
- Shin Nemoto
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device testing apparatus
- Patent number 6,384,593
- Issue date May 7, 2002
- Advantest Corporation
- Yoshihito Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device tray electronic device tray, transporting apparat...
- Patent number 6,339,321
- Issue date Jan 15, 2002
- Advantest Corporation
- Kazuyuki Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Test head positioner for semiconductor device testing apparatus
- Patent number 6,271,657
- Issue date Aug 7, 2001
- Advantest Corporation
- Shin Nemoto
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device testing apparatus
- Patent number 6,104,183
- Issue date Aug 15, 2000
- Advantest Corporation
- Yoshihito Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device testing apparatus and semiconductor device tes...
- Patent number 6,066,822
- Issue date May 23, 2000
- Advantest Corporation
- Shin Nemoto
- G01 - MEASURING TESTING
Information Patent Grant
Automatic test handler system for IC tester
- Patent number 5,865,319
- Issue date Feb 2, 1999
- Advantest Corp.
- Hiroshi Okuda
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor device testing apparatus and semiconductor device tes...
- Publication number 20020036161
- Publication date Mar 28, 2002
- Advantest Corporation
- Shin Nemoto
- G01 - MEASURING TESTING