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Shin Nemoto
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Osaka, JP
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last 30 patents
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Patent Grant
Screw surface flaw inspection method and an apparatus therefor
Patent number
4,598,998
Issue date
Jul 8, 1986
Sumitomo Kinzoku Kogyo Kabushiki Kaisha
Mitsuhito Kamei
G01 - MEASURING TESTING
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Patent Grant
Temperature pattern measuring method and a device therefor
Patent number
4,413,324
Issue date
Nov 1, 1983
Sumitomo Kinzoku Kogyo Kabushiki Kaisha
Masao Tatsuwaki
G01 - MEASURING TESTING
Information
Patent Grant
Temperature pattern measuring device
Patent number
4,365,307
Issue date
Dec 21, 1982
Sumitomo Kinzoku Kogyo Kabushiki Gaisha
Masao Tatsuwaki
G01 - MEASURING TESTING