Shin OOWADA

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Tokyo, JP

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Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR OBSERVING SURFACE
- Publication number 20250231116
- Publication date Jul 17, 2025
- TOKYO ELECTRON LIMITED
- Shin OOWADA
- G01 - MEASURING TESTING
Information Patent Application
PATTERN FORMING METHOD AND PLASMA PROCESSING METHOD
- Publication number 20240318014
- Publication date Sep 26, 2024
- TOKYO ELECTRON LIMITED
- Shin OOWADA
- C07 - ORGANIC CHEMISTRY