Shin Sakiyama

Person

Saitama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Coaxial cable member coupled to a signal terminal, a ground termina...
- Patent number 9,170,276
- Issue date Oct 27, 2015
- Molex Japan Co., Ltd.
- Teruhito Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Connector and semiconductor testing device including the connector
- Patent number 8,905,788
- Issue date Dec 9, 2014
- Molex Japan Co. Ltd.
- Kyoko Oniyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Connector and semiconductor testing device including the connector
- Patent number 8,860,454
- Issue date Oct 14, 2014
- Advantest Corporation
- Kyoko Oniyama
- G01 - MEASURING TESTING
Information Patent Grant
Connector, cable assembly, and semiconductor testing device
- Patent number 8,790,134
- Issue date Jul 29, 2014
- Molex Japan Co., Ltd.
- Nobumasa Motohashi
- G01 - MEASURING TESTING
Information Patent Grant
Connector and semiconductor test device
- Patent number 8,657,625
- Issue date Feb 25, 2014
- Molex Japan Co., Ltd.
- Hirotaka Wagata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Edge connector
- Patent number 8,550,854
- Issue date Oct 8, 2013
- Molex Incorporated
- Masato Okano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrical connector housing
- Patent number D597951
- Issue date Aug 11, 2009
- Tyco Electronics AMP K.K.
- Takahiro Hatano
- D13 - Equipment for production, distribution, or transformation of energy
Information Patent Grant
Board mount-type connector and board mount-type connector assembly
- Patent number 7,544,067
- Issue date Jun 9, 2009
- Tyco Electronics AMP K.K.
- Takahiro Hatano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrical connector
- Patent number D584693
- Issue date Jan 13, 2009
- Tyco Electronics AMP K.K.
- Takahiro Hatano
- D13 - Equipment for production, distribution, or transformation of energy
Information Patent Grant
Contact terminal for measurement, measurement apparatus, probe card...
- Patent number 7,474,109
- Issue date Jan 6, 2009
- Advantest Corporation
- Tetsuya Kuitani
- G01 - MEASURING TESTING
Information Patent Grant
Electrical connector
- Patent number D583769
- Issue date Dec 30, 2008
- Tyco Electronics AMP K.K.
- Takahiro Hatano
- D13 - Equipment for production, distribution, or transformation of energy
Information Patent Grant
Electrical connector
- Patent number D581876
- Issue date Dec 2, 2008
- Tyco Electronics AMP K.K.
- Takahiro Hatano
- D13 - Equipment for production, distribution, or transformation of energy
Information Patent Grant
Socket and test apparatus
- Patent number 7,202,686
- Issue date Apr 10, 2007
- Advantest Corporation
- Shin Sakiyama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CABLE ASSEMBLY, CONNECTOR AND SEMICONDUCTOR TESTER
- Publication number 20160187413
- Publication date Jun 30, 2016
- Molex japan co., ltd.
- Teruhito Suzuki
- G01 - MEASURING TESTING
Information Patent Application
CONNECTOR AND SEMICONDUCTOR TEST DEVICE
- Publication number 20130189866
- Publication date Jul 25, 2013
- Advantest Corporation
- Hirotaka Wagata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CABLE ASSEMBLY, CONNECTOR AND SEMICONDUCTOR TESTER
- Publication number 20130015873
- Publication date Jan 17, 2013
- Advantest Corporation
- Teruhito Suzuki
- G01 - MEASURING TESTING
Information Patent Application
CONNECTOR AND SEMICONDUCTOR TESTING DEVICE INCLUDING THE CONNECTOR
- Publication number 20120126845
- Publication date May 24, 2012
- Molex japan co., ltd.
- Kyoko Oniyama
- G01 - MEASURING TESTING
Information Patent Application
CONNECTOR, CABLE ASSEMBLY, AND SEMICONDUCTOR TESTING DEVICE
- Publication number 20120094534
- Publication date Apr 19, 2012
- ADVANTEST CORPORAITON
- Nobumasa Motohashi
- G01 - MEASURING TESTING
Information Patent Application
EDGE CONNECTOR
- Publication number 20120088388
- Publication date Apr 12, 2012
- Molex japan co., ltd.
- Masato Okano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONNECTOR AND SEMICONDUCTOR TESTING DEVICE INCLUDING THE CONNECTOR
- Publication number 20120088410
- Publication date Apr 12, 2012
- Advantest Corporation
- Kyoko Oniyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTACT PROBE AND SOCKET, AND MANUFACTURING METHOD OF TUBE PLUNGER...
- Publication number 20110221464
- Publication date Sep 15, 2011
- Advantest Corporation
- Takahiro Nagata
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION BOARD FOR ELECTRONIC DEVICE TEST APPARATUS
- Publication number 20090128172
- Publication date May 21, 2009
- Advantest Corporation
- Shintaro Takaki
- G01 - MEASURING TESTING
Information Patent Application
Socket and test apparatus
- Publication number 20070145994
- Publication date Jun 28, 2007
- Advantest Corporation
- Shin Sakiyama
- G01 - MEASURING TESTING
Information Patent Application
Socket for inspection apparatus
- Publication number 20070007984
- Publication date Jan 11, 2007
- Molex Japan Co., Ltd.
- Yutaka Kojima
- G01 - MEASURING TESTING
Information Patent Application
Contact terminal for measurement, measurement apparatus, probe card...
- Publication number 20060279304
- Publication date Dec 14, 2006
- Advantest Corporation
- Tetsuya Kuitani
- G01 - MEASURING TESTING
Information Patent Application
Socket and test apparatus
- Publication number 20060121752
- Publication date Jun 8, 2006
- Advantest Corporation
- Shin Sakiyama
- G01 - MEASURING TESTING

Shin Sakiyama

Person

Patents Grantslast 30 patents

Coaxial cable member coupled to a signal terminal, a ground termina...

Connector and semiconductor testing device including the connector

Connector and semiconductor testing device including the connector

Connector, cable assembly, and semiconductor testing device

Connector and semiconductor test device

Edge connector

Electrical connector housing

Board mount-type connector and board mount-type connector assembly

Electrical connector

Contact terminal for measurement, measurement apparatus, probe card...

Electrical connector

Electrical connector

Socket and test apparatus

Patents Applicationslast 30 patents

CABLE ASSEMBLY, CONNECTOR AND SEMICONDUCTOR TESTER

CONNECTOR AND SEMICONDUCTOR TEST DEVICE

CABLE ASSEMBLY, CONNECTOR AND SEMICONDUCTOR TESTER

CONNECTOR AND SEMICONDUCTOR TESTING DEVICE INCLUDING THE CONNECTOR

CONNECTOR, CABLE ASSEMBLY, AND SEMICONDUCTOR TESTING DEVICE

EDGE CONNECTOR

CONNECTOR AND SEMICONDUCTOR TESTING DEVICE INCLUDING THE CONNECTOR

CONTACT PROBE AND SOCKET, AND MANUFACTURING METHOD OF TUBE PLUNGER...

CALIBRATION BOARD FOR ELECTRONIC DEVICE TEST APPARATUS

Socket and test apparatus

Socket for inspection apparatus

Contact terminal for measurement, measurement apparatus, probe card...

Socket and test apparatus