Shin TOMINAGA

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Image processing apparatus, image processing method, and non-transi...
- Patent number 12,176,112
- Issue date Dec 24, 2024
- NEC Corporation
- Gaku Nakano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Control apparatus, control method, and non-transitory storage medium
- Patent number 11,983,967
- Issue date May 14, 2024
- NEC Corporation
- Hirofumi Inoue
- G07 - CHECKING-DEVICES
Information Patent Grant
Facility state analyzing device, facility state analyzing method, a...
- Patent number 11,946,603
- Issue date Apr 2, 2024
- NEC Corporation
- Masatake Takahashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Required time prediction apparatus, control method, and non-transit...
- Patent number 11,847,592
- Issue date Dec 19, 2023
- NEC Corporation
- Hirofumi Inoue
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Piping diagnostic device, piping diagnostic method, discriminant-pr...
- Patent number 11,614,205
- Issue date Mar 28, 2023
- NEC Corporation
- Soichiro Takata
- G01 - MEASURING TESTING
Information Patent Grant
Measurement time determination device, measurement time determinati...
- Patent number 11,448,565
- Issue date Sep 20, 2022
- NEC Corporation
- Hirofumi Inoue
- G01 - MEASURING TESTING
Information Patent Grant
Diagnostic device, diagnostic system, diagnostic method, and comput...
- Patent number 10,823,705
- Issue date Nov 3, 2020
- NEC Corporation
- Shin Tominaga
- G01 - MEASURING TESTING
Information Patent Grant
Position determination device, leak detection system, position dete...
- Patent number 10,458,878
- Issue date Oct 29, 2019
- NEC Corporation
- Hirofumi Inoue
- G01 - MEASURING TESTING
Information Patent Grant
Position determination device, position determination system, posit...
- Patent number 10,156,493
- Issue date Dec 18, 2018
- NEC Corporation
- Junichiro Mataga
- G01 - MEASURING TESTING
Information Patent Grant
Leakage determination system and leakage determination method
- Patent number 10,036,684
- Issue date Jul 31, 2018
- NEC Corporation
- Shohei Kinoshita
- G01 - MEASURING TESTING
Information Patent Grant
Sensor unit
- Patent number 9,709,488
- Issue date Jul 18, 2017
- NEC Corporation
- Shin Tominaga
- G02 - OPTICS
Information Patent Grant
Optical element, light source apparatus, and projection-type displa...
- Patent number 9,170,351
- Issue date Oct 27, 2015
- NEC Corporation
- Masanao Natsumeda
- G01 - MEASURING TESTING
Information Patent Grant
Optical element, light source device, and projection display device
- Patent number 9,116,270
- Issue date Aug 25, 2015
- NEC Corporation
- Masanao Natsumeda
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Display element, display device, and projection display device
- Patent number 9,110,357
- Issue date Aug 18, 2015
- NEC Corporation
- Masanao Natsumeda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Optical device for projection display device having plasmons excite...
- Patent number 9,086,619
- Issue date Jul 21, 2015
- NEC Corporation
- Masanao Natsumeda
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Optical device, optical element, and image display device
- Patent number 9,041,041
- Issue date May 26, 2015
- NEC Corporation
- Masanao Natsumeda
- F21 - LIGHTING
Information Patent Grant
Display element, display device, and projection display device
- Patent number 9,039,201
- Issue date May 26, 2015
- NEC Corporation
- Masanao Natsumeda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Light emitting element, light source device, and projection display...
- Patent number 9,028,071
- Issue date May 12, 2015
- NEC Corporation
- Masanao Natsumeda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Optical element, light source device, and projection-type display d...
- Patent number 8,998,420
- Issue date Apr 7, 2015
- NEC Corporation
- Shin Tominaga
- G02 - OPTICS
Information Patent Grant
Light source and projection-type display device
- Patent number 8,994,055
- Issue date Mar 31, 2015
- NEC Corporation
- Shin Tominaga
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Optical element, light source device, and projection display device
- Patent number 8,960,915
- Issue date Feb 24, 2015
- NEC Corporation
- Shin Tominaga
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Optical element, light source device, and projection-type display d...
- Patent number 8,894,210
- Issue date Nov 25, 2014
- NEC Corporation
- Shin Tominaga
- G02 - OPTICS
Information Patent Grant
Optical information recording/reproducing device, optical unit, and...
- Patent number 8,238,219
- Issue date Aug 7, 2012
- NEC Corporation
- Shin Tominaga
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
ACTIVITY SUPPORT APPARATUS, ACTIVITY SUPPORT METHOD, AND COMPUTER R...
- Publication number 20240212470
- Publication date Jun 27, 2024
- NEC Corporation
- Shigeki SHINODA
- G08 - SIGNALLING
Information Patent Application
INFORMATION PROCESSING SYSTEM, INFORMATION PROCESSING METHOD, AND N...
- Publication number 20240104680
- Publication date Mar 28, 2024
- NEC Corporation
- Shin TOMINAGA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ROAD SURVEILLANCE SYSTEM, ROAD SURVEILLANCE METHOD, AND NON-TRANSIT...
- Publication number 20240104931
- Publication date Mar 28, 2024
- NEC Corporation
- Shin TOMINAGA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ROAD SURVEILLANCE SYSTEM, ROAD SURVEILLANCE METHOD, AND NON-TRANSIT...
- Publication number 20240105053
- Publication date Mar 28, 2024
- NEC Corporation
- Shin TOMINAGA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND NONTRANSIT...
- Publication number 20240020837
- Publication date Jan 18, 2024
- NEC Corporation
- Gaku Nakano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND NON-TRANSI...
- Publication number 20230307138
- Publication date Sep 28, 2023
- NEC Corporation
- Gaku Nakano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND NON-TRANSI...
- Publication number 20230298166
- Publication date Sep 21, 2023
- NEC Corporation
- Gaku Nakano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND NON-TRANSI...
- Publication number 20230274553
- Publication date Aug 31, 2023
- NEC Corporation
- Gaku Nakano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND NON-TRANSI...
- Publication number 20230238149
- Publication date Jul 27, 2023
- NEC Corporation
- Gaku Nakano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND NON-TRANSI...
- Publication number 20230230380
- Publication date Jul 20, 2023
- NEC Corporation
- Gaku Nakano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ACTIVITY SUPPORT APPARATUS, ACTIVITY SUPPORT METHOD, AND COMPUTER R...
- Publication number 20230115168
- Publication date Apr 13, 2023
- NEC Corporation
- Shigeki SHINODA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REQUIRED TIME PREDICTION APPARATUS, CONTROL METHOD, AND NON-TRANSIT...
- Publication number 20230046797
- Publication date Feb 16, 2023
- NEC Corporation
- Hirofumi INOUE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTROL APPARATUS, CONTROL METHOD, AND NON-TRANSITORY STORAGE MEDIUM
- Publication number 20230033538
- Publication date Feb 2, 2023
- NEC Corporation
- Hirofumi INOUE
- G07 - CHECKING-DEVICES
Information Patent Application
PIPING DIAGNOSTIC DEVICE, PIPING DIAGNOSTIC METHOD, DISCRIMINANT-PR...
- Publication number 20210190272
- Publication date Jun 24, 2021
- NEC Corporation
- Soichiro TAKATA
- F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS
Information Patent Application
ASSET MANAGEMENT DEVICE AND ASSET MANAGEMENT METHOD
- Publication number 20200401971
- Publication date Dec 24, 2020
- NEC Corporation
- Shin TOMINAGA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FACILITY STATE ANALYZING DEVICE, FACILITY STATE ANALYZING METHOD, A...
- Publication number 20200347994
- Publication date Nov 5, 2020
- NEC Corporation
- Masatake TAKAHASHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASUREMENT TIME DETERMINATION DEVICE, MEASUREMENT TIME DETERMINATI...
- Publication number 20190368964
- Publication date Dec 5, 2019
- NEC Corporation
- Hirofumi INOUE
- G01 - MEASURING TESTING
Information Patent Application
LEAKAGE POSITION ANALYZING SYSTEM, LEAKAGE POSITION ANALYZING METHO...
- Publication number 20190137044
- Publication date May 9, 2019
- NEC Corporation
- Masatake TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
PIPE CONDITION DETECTION DEVICE, PIPE CONDITION DETECTION METHOD, C...
- Publication number 20180292292
- Publication date Oct 11, 2018
- NEC Corporation
- Masatake TAKAHASHI
- F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS
Information Patent Application
CONDITION ASSESSMENT DEVICE, CONDITION ASSESSMENT METHOD, PROGRAM R...
- Publication number 20180136173
- Publication date May 17, 2018
- NEC Corporation
- Masatake TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
DEFECT ANALYSIS DEVICE, DEFECT ANALYSIS SYSTEM, DEFECT ANALYSIS MET...
- Publication number 20180045687
- Publication date Feb 15, 2018
- NEC Corporation
- Shin TOMINAGA
- G01 - MEASURING TESTING
Information Patent Application
POSITION DETERMINATION DEVICE, POSITION DETERMINATION SYSTEM, POSIT...
- Publication number 20170322104
- Publication date Nov 9, 2017
- NEC Corporation
- Junichiro MATAGA
- G01 - MEASURING TESTING
Information Patent Application
DIAGNOSTIC DEVICE, DIAGNOSTIC SYSTEM, DIAGNOSTIC METHOD, AND COMPUT...
- Publication number 20170205376
- Publication date Jul 20, 2017
- NEC Corporation
- Shin TOMINAGA
- G01 - MEASURING TESTING
Information Patent Application
POSITION DETERMINATION DEVICE, LEAK DETECTION SYSTEM, POSITION DETE...
- Publication number 20170102286
- Publication date Apr 13, 2017
- NEC Corporation
- Hirofumi INOUE
- G01 - MEASURING TESTING
Information Patent Application
LEAKAGE DETERMINATION SYSTEM AND LEAKAGE DETERMINATION METHOD
- Publication number 20160282219
- Publication date Sep 29, 2016
- NEC Corporation
- Shohei KINOSHITA
- G01 - MEASURING TESTING
Information Patent Application
SENSOR UNIT
- Publication number 20160216203
- Publication date Jul 28, 2016
- NEC Corporation
- Shin TOMINAGA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL ELEMENT, ILLUMINATION DEVICE, IMAGE DISPLAY DEVICE, METHOD...
- Publication number 20150301282
- Publication date Oct 22, 2015
- NEC Corporation
- Masanao Natsumeda
- G02 - OPTICS
Information Patent Application
OPTICAL ELEMENT, LIGHTING DEVICE, AND IMAGE DISPLAY DEVICE
- Publication number 20150109587
- Publication date Apr 23, 2015
- Masanao Natsumeda
- G02 - OPTICS
Information Patent Application
OPTICAL ELEMENT, OPTICAL DEVICE, AND DISPLAY DEVICE
- Publication number 20150022784
- Publication date Jan 22, 2015
- NEC Corporation
- Shin Tominaga
- G02 - OPTICS
Information Patent Application
OPTICAL DEVICE, OPTICAL ELEMENT, AND IMAGE DISPLAY DEVICE
- Publication number 20150016085
- Publication date Jan 15, 2015
- NEC Corporation
- Masanao Natsumeda
- G02 - OPTICS

Shin TOMINAGA

Person

Patents Grantslast 30 patents

Image processing apparatus, image processing method, and non-transi...

Control apparatus, control method, and non-transitory storage medium

Facility state analyzing device, facility state analyzing method, a...

Required time prediction apparatus, control method, and non-transit...

Piping diagnostic device, piping diagnostic method, discriminant-pr...

Measurement time determination device, measurement time determinati...

Diagnostic device, diagnostic system, diagnostic method, and comput...

Position determination device, leak detection system, position dete...

Position determination device, position determination system, posit...

Leakage determination system and leakage determination method

Sensor unit

Optical element, light source apparatus, and projection-type displa...

Optical element, light source device, and projection display device

Display element, display device, and projection display device

Optical device for projection display device having plasmons excite...

Optical device, optical element, and image display device

Display element, display device, and projection display device

Light emitting element, light source device, and projection display...

Optical element, light source device, and projection-type display d...

Light source and projection-type display device

Optical element, light source device, and projection display device

Optical element, light source device, and projection-type display d...

Optical information recording/reproducing device, optical unit, and...

Patents Applicationslast 30 patents

ACTIVITY SUPPORT APPARATUS, ACTIVITY SUPPORT METHOD, AND COMPUTER R...

INFORMATION PROCESSING SYSTEM, INFORMATION PROCESSING METHOD, AND N...

ROAD SURVEILLANCE SYSTEM, ROAD SURVEILLANCE METHOD, AND NON-TRANSIT...

ROAD SURVEILLANCE SYSTEM, ROAD SURVEILLANCE METHOD, AND NON-TRANSIT...

IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND NONTRANSIT...

IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND NON-TRANSI...

IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND NON-TRANSI...

IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND NON-TRANSI...

IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND NON-TRANSI...

IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND NON-TRANSI...

ACTIVITY SUPPORT APPARATUS, ACTIVITY SUPPORT METHOD, AND COMPUTER R...

REQUIRED TIME PREDICTION APPARATUS, CONTROL METHOD, AND NON-TRANSIT...

CONTROL APPARATUS, CONTROL METHOD, AND NON-TRANSITORY STORAGE MEDIUM

PIPING DIAGNOSTIC DEVICE, PIPING DIAGNOSTIC METHOD, DISCRIMINANT-PR...

ASSET MANAGEMENT DEVICE AND ASSET MANAGEMENT METHOD

FACILITY STATE ANALYZING DEVICE, FACILITY STATE ANALYZING METHOD, A...

MEASUREMENT TIME DETERMINATION DEVICE, MEASUREMENT TIME DETERMINATI...

LEAKAGE POSITION ANALYZING SYSTEM, LEAKAGE POSITION ANALYZING METHO...

PIPE CONDITION DETECTION DEVICE, PIPE CONDITION DETECTION METHOD, C...

CONDITION ASSESSMENT DEVICE, CONDITION ASSESSMENT METHOD, PROGRAM R...

DEFECT ANALYSIS DEVICE, DEFECT ANALYSIS SYSTEM, DEFECT ANALYSIS MET...

POSITION DETERMINATION DEVICE, POSITION DETERMINATION SYSTEM, POSIT...

DIAGNOSTIC DEVICE, DIAGNOSTIC SYSTEM, DIAGNOSTIC METHOD, AND COMPUT...

POSITION DETERMINATION DEVICE, LEAK DETECTION SYSTEM, POSITION DETE...

LEAKAGE DETERMINATION SYSTEM AND LEAKAGE DETERMINATION METHOD

SENSOR UNIT

OPTICAL ELEMENT, ILLUMINATION DEVICE, IMAGE DISPLAY DEVICE, METHOD...

OPTICAL ELEMENT, LIGHTING DEVICE, AND IMAGE DISPLAY DEVICE

OPTICAL ELEMENT, OPTICAL DEVICE, AND DISPLAY DEVICE

OPTICAL DEVICE, OPTICAL ELEMENT, AND IMAGE DISPLAY DEVICE