Shin UCHIDA

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Yamanashi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Testing system
- Patent number 11,454,664
- Issue date Sep 27, 2022
- Tokyo Electron Limited
- Kentaro Konishi
- G01 - MEASURING TESTING
Information Patent Grant
Analysis device and image generation method
- Patent number 11,428,712
- Issue date Aug 30, 2022
- Tokyo Electron Limited
- Shin Uchida
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system, wafer map display, wafer map display method, and...
- Patent number 11,009,544
- Issue date May 18, 2021
- Tokyo Electron Limited
- Shin Uchida
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ANALYSIS DEVICE AND IMAGE GENERATION METHOD
- Publication number 20220026465
- Publication date Jan 27, 2022
- TOKYO ELECTRON LIMITED
- Shin UCHIDA
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS APPARATUS AND IMAGE CREATION METHOD
- Publication number 20210372944
- Publication date Dec 2, 2021
- TOKYO ELECTRON LIMITED
- Shin UCHIDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TESTING SYSTEM
- Publication number 20210333319
- Publication date Oct 28, 2021
- TOKYO ELECTRON LIMITED
- Kentaro KONISHI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM, WAFER MAP DISPLAY, WAFER MAP DISPLAY METHOD, AND...
- Publication number 20200064398
- Publication date Feb 27, 2020
- Shin UCHIDA
- G01 - MEASURING TESTING