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Shin UCHINO
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Image data processing method and image creating method
Patent number
8,761,488
Issue date
Jun 24, 2014
Sumco Corporation
Eiji Kamiyama
G01 - MEASURING TESTING
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Patent Grant
Method of evaluating silicon wafer and method of manufacturing sili...
Patent number
8,411,263
Issue date
Apr 2, 2013
Sumco Corporation
Shin Uchino
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD OF EVALUATING SILICON WAFER AND METHOD OF MANUFACTURING SILI...
Publication number
20120293793
Publication date
Nov 22, 2012
SUMCO CORPORATION
Shin UCHINO
G01 - MEASURING TESTING
Information
Patent Application
IMAGE DATA PROCESSING METHOD AND IMAGE CREATING METHOD
Publication number
20110194753
Publication date
Aug 11, 2011
SUMCO CORPORATION
Eiji Kamiyama
G06 - COMPUTING CALCULATING COUNTING