Shin-Wook Yi

Person

Hwaseong-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
System and method of analyzing a crystal defect
- Patent number 10,727,025
- Issue date Jul 28, 2020
- Samsung Electronics Co., Ltd.
- Sung-Bo Shim
- G01 - MEASURING TESTING
Information Patent Grant
Delay locked loop circuit and integrated circuit including the same
- Patent number 10,128,853
- Issue date Nov 13, 2018
- Samsung Electronics Co., Ltd.
- Kwan-yeob Chae
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Data processing circuit for controlling sampling point independentl...
- Patent number 9,864,720
- Issue date Jan 9, 2018
- Samsung Electronics Co., Ltd.
- Kwan Yeob Chae
- G11 - INFORMATION STORAGE
Information Patent Grant
Hybrid apparatus and methods for analyzing electromagnetic waves
- Patent number 9,229,226
- Issue date Jan 5, 2016
- Samsung Electronics Co., Ltd.
- Shin-Wook Yi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Unit pixels, depth sensors and three-dimensional image sensors incl...
- Patent number 9,103,722
- Issue date Aug 11, 2015
- Samsung Electronics Co., Ltd.
- Hyoung-Soo Ko
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Unit pixels, depth sensors and three-dimensional image sensors incl...
- Patent number 8,901,498
- Issue date Dec 2, 2014
- Samsung Electronics Co., Ltd.
- Hyoung-Soo Ko
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD OF ANALYZING A CRYSTAL DEFECT
- Publication number 20200020506
- Publication date Jan 16, 2020
- Samsung Electronics Co., Ltd.
- Sung-Bo Shim
- G01 - MEASURING TESTING
Information Patent Application
DELAY CONTROL CIRCUITS
- Publication number 20190190505
- Publication date Jun 20, 2019
- Samsung Electronics Co., Ltd.
- Shin Young YI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DELAY LOCKED LOOP CIRCUIT AND INTEGRATED CIRCUIT INCLUDING THE SAME
- Publication number 20180048319
- Publication date Feb 15, 2018
- Samsung Electronics Co., Ltd.
- Kwan-yeob CHAE
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DATA PROCESSING CIRCUIT FOR CONTROLLING SAMPLING POINT INDEPENDENTL...
- Publication number 20170092344
- Publication date Mar 30, 2017
- Samsung Electronics Co., Ltd.
- Kwan Yeob CHAE
- G11 - INFORMATION STORAGE
Information Patent Application
UNIT PIXELS, DEPTH SENSORS AND THREE-DIMENSIONAL IMAGE SENSORS INCL...
- Publication number 20150069244
- Publication date Mar 12, 2015
- Samsung Electronics Co., Ltd.
- Hyoung-Soo KO
- G01 - MEASURING TESTING
Information Patent Application
DISTANCE MEASURING SENSOR
- Publication number 20130148097
- Publication date Jun 13, 2013
- Samsung Electronics Co., Ltd.
- Jae-sung SHIN
- G01 - MEASURING TESTING
Information Patent Application
HYBRID APPARATUS AND METHODS FOR ANALYZING ELECTROMAGNETIC WAVES
- Publication number 20120330630
- Publication date Dec 27, 2012
- Shin-Wook Yi
- G02 - OPTICS
Information Patent Application
UNIT PIXELS, DEPTH SENSORS AND THREE-DIMENSIONAL IMAGE SENSORS INCL...
- Publication number 20120281206
- Publication date Nov 8, 2012
- Hyoung-Soo Ko
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Shin-Wook Yi

Person

Patents Grantslast 30 patents

System and method of analyzing a crystal defect

Delay locked loop circuit and integrated circuit including the same

Data processing circuit for controlling sampling point independentl...

Hybrid apparatus and methods for analyzing electromagnetic waves

Unit pixels, depth sensors and three-dimensional image sensors incl...

Unit pixels, depth sensors and three-dimensional image sensors incl...

Patents Applicationslast 30 patents

SYSTEM AND METHOD OF ANALYZING A CRYSTAL DEFECT

DELAY CONTROL CIRCUITS

DELAY LOCKED LOOP CIRCUIT AND INTEGRATED CIRCUIT INCLUDING THE SAME

DATA PROCESSING CIRCUIT FOR CONTROLLING SAMPLING POINT INDEPENDENTL...

UNIT PIXELS, DEPTH SENSORS AND THREE-DIMENSIONAL IMAGE SENSORS INCL...

DISTANCE MEASURING SENSOR

HYBRID APPARATUS AND METHODS FOR ANALYZING ELECTROMAGNETIC WAVES

UNIT PIXELS, DEPTH SENSORS AND THREE-DIMENSIONAL IMAGE SENSORS INCL...