Shingo Hayashi

Person

Otsu-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Measurement method for amount of deviation, and measurement apparatus
- Patent number 12,072,180
- Issue date Aug 27, 2024
- Omron Corporation
- Shingo Hayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Appearance inspection device and defect inspection method
- Patent number 11,936,985
- Issue date Mar 19, 2024
- Omron Corporation
- Shingo Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Position measurement method using a calibration plate to correct a...
- Patent number 11,709,050
- Issue date Jul 25, 2023
- Omron Corporation
- Shingo Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Method for correcting values detected by linear scales
- Patent number 11,333,535
- Issue date May 17, 2022
- Omron Corporation
- Keita Ebisawa
- G01 - MEASURING TESTING
Information Patent Grant
Visual inspection device and illumination condition setting method...
- Patent number 10,805,552
- Issue date Oct 13, 2020
- Omron Corporation
- Shingo Hayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electret fiber sheet
- Patent number 10,512,861
- Issue date Dec 24, 2019
- Toray Industries, Inc.
- Yuji Iyama
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT METHOD FOR AMOUNT OF DEVIATION, AND MEASUREMENT APPARATUS
- Publication number 20230243646
- Publication date Aug 3, 2023
- Omron Corporation
- Shingo HAYASHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRET FIBER SHEET, LAMINATE SHEET, AND FILTER
- Publication number 20230233966
- Publication date Jul 27, 2023
- TORAY INDUSTRIES, INC.
- Rika Kameshima
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
POSITION MEASUREMENT METHOD
- Publication number 20220397386
- Publication date Dec 15, 2022
- Omron Corporation
- Shingo HAYASHI
- G01 - MEASURING TESTING
Information Patent Application
EXTERNAL APPEARANCE INSPECTION APPARATUS AND EXTERNAL APPEARANCE IN...
- Publication number 20220381700
- Publication date Dec 1, 2022
- Omron Corporation
- Shingo HAYASHI
- G01 - MEASURING TESTING
Information Patent Application
APPEARANCE INSPECTION DEVICE AND DEFECT INSPECTION METHOD
- Publication number 20220360720
- Publication date Nov 10, 2022
- Omron Corporation
- Shingo HAYASHI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD FOR CORRECTING VALUES DETECTED BY LINEAR SCALES
- Publication number 20220003580
- Publication date Jan 6, 2022
- Omron Corporation
- Keita EBISAWA
- G01 - MEASURING TESTING
Information Patent Application
NONWOVEN FABRIC AND AIR FILTER MATERIAL INCLUDING THE SAME
- Publication number 20200370217
- Publication date Nov 26, 2020
- TORAY INDUSTRIES, INC.
- Shingo Hayashi
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
VISUAL INSPECTION DEVICE AND ILLUMINATION CONDITION SETTING METHOD...
- Publication number 20190268522
- Publication date Aug 29, 2019
- Omron Corporation
- Shingo HAYASHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRET FIBER SHEET
- Publication number 20180369729
- Publication date Dec 27, 2018
- TORAY INDUSTRIES, INC.
- Yuji Iyama
- D04 - BRAIDING LACE-MAKING KNITTING TRIMMINGS NON-WOVEN FABRICS

Shingo Hayashi

Person

Patents Grantslast 30 patents

Measurement method for amount of deviation, and measurement apparatus

Appearance inspection device and defect inspection method

Position measurement method using a calibration plate to correct a...

Method for correcting values detected by linear scales

Visual inspection device and illumination condition setting method...

Electret fiber sheet

Patents Applicationslast 30 patents

MEASUREMENT METHOD FOR AMOUNT OF DEVIATION, AND MEASUREMENT APPARATUS

ELECTRET FIBER SHEET, LAMINATE SHEET, AND FILTER

POSITION MEASUREMENT METHOD

EXTERNAL APPEARANCE INSPECTION APPARATUS AND EXTERNAL APPEARANCE IN...

APPEARANCE INSPECTION DEVICE AND DEFECT INSPECTION METHOD

METHOD FOR CORRECTING VALUES DETECTED BY LINEAR SCALES

NONWOVEN FABRIC AND AIR FILTER MATERIAL INCLUDING THE SAME

VISUAL INSPECTION DEVICE AND ILLUMINATION CONDITION SETTING METHOD...

ELECTRET FIBER SHEET