Shingo Imanishi

Person

Kanagawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Microparticle analyzer and microparticle analysis method
- Patent number 11,156,544
- Issue date Oct 26, 2021
- Sony Corporation
- Yuya Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Micro particle analyzer and micro particle analysis method
- Patent number 10,591,400
- Issue date Mar 17, 2020
- Sony Corporation
- Yuya Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Data correction method in fine particle measuring device and fine p...
- Patent number 10,371,632
- Issue date Aug 6, 2019
- Sony Corporation
- Nao Nitta
- G01 - MEASURING TESTING
Information Patent Grant
Microparticle measuring apparatus
- Patent number 9,816,913
- Issue date Nov 14, 2017
- Sony Corporation
- Taichi Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Optical measuring device and optical measuring method
- Patent number 9,766,174
- Issue date Sep 19, 2017
- Sony Corporation
- Shunpei Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Microparticle measuring apparatus
- Patent number 9,429,508
- Issue date Aug 30, 2016
- Sony Corporation
- Taichi Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Fine particle measurement apparatus and optical axis calibration me...
- Patent number 8,994,940
- Issue date Mar 31, 2015
- Sony Corporation
- Suguru Dowaki
- G01 - MEASURING TESTING
Information Patent Grant
Optical measuring device and optical measuring method
- Patent number 8,780,338
- Issue date Jul 15, 2014
- Sony Corporation
- Shunpei Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Fine particle optical measuring method in fluidic channels
- Patent number 8,553,229
- Issue date Oct 8, 2013
- Sony Corporation
- Motohiro Furuki
- G01 - MEASURING TESTING
Information Patent Grant
Pattern-formed substrate, pattern-forming method, and die
- Patent number 8,545,969
- Issue date Oct 1, 2013
- Sony Corporation
- Shingo Imanishi
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Microchip and particulate fractional collection apparatus
- Patent number 8,487,273
- Issue date Jul 16, 2013
- Sony Corporaiton
- Tatsumi Ito
- G01 - MEASURING TESTING
Information Patent Grant
Optical measuring device
- Patent number 8,467,055
- Issue date Jun 18, 2013
- Sony Corporation
- Shingo Imanishi
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing microlens and method for manufacturing sol...
- Patent number 8,309,000
- Issue date Nov 13, 2012
- Sony Corporation
- Goro Fujita
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Optical flow channel measuring instrument
- Patent number 8,263,956
- Issue date Sep 11, 2012
- Sony Corporation
- Shingo Imanishi
- G01 - MEASURING TESTING
Information Patent Grant
Optical measuring device, optical measuring apparatus and fine part...
- Patent number 8,077,313
- Issue date Dec 13, 2011
- Sony Corporation
- Motohiro Furuki
- G01 - MEASURING TESTING
Information Patent Grant
Optical detection method and optical detection apparatus for a fine...
- Patent number 8,035,815
- Issue date Oct 11, 2011
- Sony Corporation
- Masataka Shinoda
- G01 - MEASURING TESTING
Information Patent Grant
Optical measuring device
- Patent number 7,880,879
- Issue date Feb 1, 2011
- Sony Corporation
- Motohiro Furuki
- G01 - MEASURING TESTING
Information Patent Grant
Laser drawing method and apparatus
- Patent number 7,821,703
- Issue date Oct 26, 2010
- Sony Corporation
- Shingo Imanishi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Information recording and/or reproducing apparatus
- Patent number 7,317,668
- Issue date Jan 8, 2008
- Sony Corporation
- Minoru Takeda
- G11 - INFORMATION STORAGE
Information Patent Grant
Information recording and/or reproducing apparatus
- Patent number 7,180,833
- Issue date Feb 20, 2007
- Sony Corporation
- Minoru Takeda
- G11 - INFORMATION STORAGE
Information Patent Grant
Stamper for producing optical recording medium, optical recording m...
- Patent number 7,171,676
- Issue date Jan 30, 2007
- Sony Corporation
- Minoru Takeda
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Exposure apparatus, exposure method, recording and/or reproducing a...
- Patent number 7,099,259
- Issue date Aug 29, 2006
- Sony Corporation
- Shingo Imanishi
- G11 - INFORMATION STORAGE
Information Patent Grant
Stamper for producing optical recording medium, optical recording m...
- Patent number 6,971,116
- Issue date Nov 29, 2005
- Sony Corporation
- Minoru Takeda
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Focus control method and focus controller
- Patent number 6,845,066
- Issue date Jan 18, 2005
- Sony Corporation
- Imanishi Shingo
- G11 - INFORMATION STORAGE
Information Patent Grant
Photolithography apparatus and exposure method
- Patent number 6,798,493
- Issue date Sep 28, 2004
- Sony Corporation
- Shingo Imanishi
- G11 - INFORMATION STORAGE
Information Patent Grant
Optical disc apparatus and focusing control method in an optical di...
- Patent number 6,738,323
- Issue date May 18, 2004
- Sony Corporation
- Shingo Imanishi
- G11 - INFORMATION STORAGE
Information Patent Grant
Controlling a gap length in a near-field area in an exposure apparatus
- Patent number 6,717,896
- Issue date Apr 6, 2004
- Sony Corporation
- Shingo Imanishi
- G11 - INFORMATION STORAGE
Information Patent Grant
Exposure apparatus and exposure method
- Patent number 6,704,096
- Issue date Mar 9, 2004
- Sony Corporation
- Minoru Takeda
- G11 - INFORMATION STORAGE
Information Patent Grant
Optical recording medium having disconnected land and groove formin...
- Patent number 6,466,538
- Issue date Oct 15, 2002
- Sony Corporation
- Shingo Imanishi
- G11 - INFORMATION STORAGE
Information Patent Grant
BEAM IRRADIATION APPARATUS, OPTICAL APPARATUS HAVING BEAM IRRADIATI...
- Patent number 6,442,110
- Issue date Aug 27, 2002
- Sony Corporation
- Masanobu Yamamoto
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
DETECTION OPTICAL SYSTEM, DETECTION DEVICE, FLOW CYTOMETER, AND IMA...
- Publication number 20220404263
- Publication date Dec 22, 2022
- SONY GROUP CORPORATION
- TAKESHI HATAKEYAMA
- G01 - MEASURING TESTING
Information Patent Application
MICRO PARTICLE ANALYZER AND MICRO PARTICLE ANALYSIS METHOD
- Publication number 20200173905
- Publication date Jun 4, 2020
- SONY CORPORATION
- Yuya Suzuki
- G01 - MEASURING TESTING
Information Patent Application
MICRO PARTICLE ANALYZER AND MICRO PARTICLE ANALYSIS METHOD
- Publication number 20190301994
- Publication date Oct 3, 2019
- SONY CORPORATION
- Yuya Suzuki
- G01 - MEASURING TESTING
Information Patent Application
MICROPARTICLE MEASURING APPARATUS
- Publication number 20170030824
- Publication date Feb 2, 2017
- SONY CORPORATION
- Taichi Takeuchi
- G01 - MEASURING TESTING
Information Patent Application
MICROPARTICLE MEASURING APPARATUS
- Publication number 20150276575
- Publication date Oct 1, 2015
- SONY CORPORATION
- Taichi Takeuchi
- G01 - MEASURING TESTING
Information Patent Application
DATA CORRECTION METHOD IN FINE PARTICLE MEASURING DEVICE AND FINE P...
- Publication number 20150112627
- Publication date Apr 23, 2015
- SONY CORPORATION
- Nao Nitta
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASURING DEVICE AND OPTICAL MEASURING METHOD
- Publication number 20140293273
- Publication date Oct 2, 2014
- SONY CORPORATION
- Shunpei Suzuki
- G01 - MEASURING TESTING
Information Patent Application
MICROCHIP AND PARTICULATE FRACTIONAL COLLECTION APPARATUS
- Publication number 20120153185
- Publication date Jun 21, 2012
- SONY CORPORATION
- Tatsumi Ito
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
FINE PARTICLE MEASUREMENT APPARATUS AND OPTICAL AXIS CALIBRATION ME...
- Publication number 20120050737
- Publication date Mar 1, 2012
- SONY CORPORATION
- Suguru Dowaki
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASURING DEVICE AND OPTICAL MEASURING METHOD
- Publication number 20110222050
- Publication date Sep 15, 2011
- SONY CORPORATION
- Shunpei Suzuki
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASURING DEVICE
- Publication number 20100096560
- Publication date Apr 22, 2010
- SONY CORPORATION
- Shingo Imanishi
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASURING DEVICE
- Publication number 20100020321
- Publication date Jan 28, 2010
- SONY CORPORATION
- Motohiro Furuki
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASURING INSTRUMENT, AND WAVELENGTH CALIBRATION METHOD AND...
- Publication number 20090294702
- Publication date Dec 3, 2009
- SONY CORPORATION
- Shingo Imanishi
- G01 - MEASURING TESTING
Information Patent Application
HOLOGRAM SUBSTRATE, METHOD FOR PRODUCING SAME, AND ELECTRONIC DEVICE
- Publication number 20090231648
- Publication date Sep 17, 2009
- SONY CORPORATION
- Shingo Imanishi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR MANUFACTURING MICROLENS AND METHOD FOR MANUFACTURING SOL...
- Publication number 20090189302
- Publication date Jul 30, 2009
- SONY CORPORATION
- Goro Fujita
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
FINE PARTICLE MEASURING METHOD, SUBSTRATE FOR MEASUREMENT, AND MEAS...
- Publication number 20090116005
- Publication date May 7, 2009
- Motohiro FURUKI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DETECTION METHOD AND OPTICAL DETECTION APPARATUS FOR A FINE...
- Publication number 20090108214
- Publication date Apr 30, 2009
- Masataka SHINODA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASURING DEVICE, OPTICAL MEASURING APPARATUS AND FINE PART...
- Publication number 20090101847
- Publication date Apr 23, 2009
- Motohiro FURUKI
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Laser drawing method and apparatus
- Publication number 20080231940
- Publication date Sep 25, 2008
- Sony Corporation
- Shingo Imanishi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
PATTERN-FORMED SUBSTRATE, PATTERN-FORMING METHOD, AND DIE
- Publication number 20080233361
- Publication date Sep 25, 2008
- SONY CORPORATION
- Shingo Imanishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INFORMATION RECORDING AND/OR REPRODUCING APPARATUS
- Publication number 20070104074
- Publication date May 10, 2007
- SONY CORPORATION
- Minoru Takeda
- G11 - INFORMATION STORAGE
Information Patent Application
Mastering apparatus, mastering method and optical recording medium
- Publication number 20060159001
- Publication date Jul 20, 2006
- Shingo Imanishi
- G11 - INFORMATION STORAGE
Information Patent Application
Stamper for producing optical recording medium, optical recording m...
- Publication number 20050219992
- Publication date Oct 6, 2005
- Sony Corporation
- Minoru Takeda
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
Stamper for producing optical recording medium, optical recording m...
- Publication number 20050167868
- Publication date Aug 4, 2005
- Sony Corporation
- Minoru Takeda
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
Method for manufacturing original disk for recording medium, and st...
- Publication number 20040051052
- Publication date Mar 18, 2004
- Shingo Imanishi
- G11 - INFORMATION STORAGE
Information Patent Application
Information recording and/or reproducing apparatus
- Publication number 20040047270
- Publication date Mar 11, 2004
- SONY CORPORATION
- Minoru Takeda
- G11 - INFORMATION STORAGE
Information Patent Application
Exposure apparatus, exposure method, recording and/or reproducing a...
- Publication number 20030184832
- Publication date Oct 2, 2003
- Shingo Imanishi
- G11 - INFORMATION STORAGE
Information Patent Application
Photolithography apparatus and exposure method
- Publication number 20030174301
- Publication date Sep 18, 2003
- Shingo Imanishi
- G11 - INFORMATION STORAGE
Information Patent Application
Stamper for producing optical recording medium, optical recording m...
- Publication number 20030031116
- Publication date Feb 13, 2003
- Minoru Takeda
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL

Shingo Imanishi

Person

Patents Grantslast 30 patents

Microparticle analyzer and microparticle analysis method

Micro particle analyzer and micro particle analysis method

Data correction method in fine particle measuring device and fine p...

Microparticle measuring apparatus

Optical measuring device and optical measuring method

Microparticle measuring apparatus

Fine particle measurement apparatus and optical axis calibration me...

Optical measuring device and optical measuring method

Fine particle optical measuring method in fluidic channels

Pattern-formed substrate, pattern-forming method, and die

Microchip and particulate fractional collection apparatus

Optical measuring device

Method for manufacturing microlens and method for manufacturing sol...

Optical flow channel measuring instrument

Optical measuring device, optical measuring apparatus and fine part...

Optical detection method and optical detection apparatus for a fine...

Optical measuring device

Laser drawing method and apparatus

Information recording and/or reproducing apparatus

Information recording and/or reproducing apparatus

Stamper for producing optical recording medium, optical recording m...

Exposure apparatus, exposure method, recording and/or reproducing a...

Stamper for producing optical recording medium, optical recording m...

Focus control method and focus controller

Photolithography apparatus and exposure method

Optical disc apparatus and focusing control method in an optical di...

Controlling a gap length in a near-field area in an exposure apparatus

Exposure apparatus and exposure method

Optical recording medium having disconnected land and groove formin...

BEAM IRRADIATION APPARATUS, OPTICAL APPARATUS HAVING BEAM IRRADIATI...

Patents Applicationslast 30 patents

DETECTION OPTICAL SYSTEM, DETECTION DEVICE, FLOW CYTOMETER, AND IMA...

MICRO PARTICLE ANALYZER AND MICRO PARTICLE ANALYSIS METHOD

MICRO PARTICLE ANALYZER AND MICRO PARTICLE ANALYSIS METHOD

MICROPARTICLE MEASURING APPARATUS

MICROPARTICLE MEASURING APPARATUS

DATA CORRECTION METHOD IN FINE PARTICLE MEASURING DEVICE AND FINE P...

OPTICAL MEASURING DEVICE AND OPTICAL MEASURING METHOD

MICROCHIP AND PARTICULATE FRACTIONAL COLLECTION APPARATUS

FINE PARTICLE MEASUREMENT APPARATUS AND OPTICAL AXIS CALIBRATION ME...

OPTICAL MEASURING DEVICE AND OPTICAL MEASURING METHOD

OPTICAL MEASURING DEVICE

OPTICAL MEASURING DEVICE

OPTICAL MEASURING INSTRUMENT, AND WAVELENGTH CALIBRATION METHOD AND...

HOLOGRAM SUBSTRATE, METHOD FOR PRODUCING SAME, AND ELECTRONIC DEVICE

METHOD FOR MANUFACTURING MICROLENS AND METHOD FOR MANUFACTURING SOL...

FINE PARTICLE MEASURING METHOD, SUBSTRATE FOR MEASUREMENT, AND MEAS...

OPTICAL DETECTION METHOD AND OPTICAL DETECTION APPARATUS FOR A FINE...

OPTICAL MEASURING DEVICE, OPTICAL MEASURING APPARATUS AND FINE PART...

Laser drawing method and apparatus

PATTERN-FORMED SUBSTRATE, PATTERN-FORMING METHOD, AND DIE

INFORMATION RECORDING AND/OR REPRODUCING APPARATUS

Mastering apparatus, mastering method and optical recording medium

Stamper for producing optical recording medium, optical recording m...

Stamper for producing optical recording medium, optical recording m...

Method for manufacturing original disk for recording medium, and st...

Information recording and/or reproducing apparatus

Exposure apparatus, exposure method, recording and/or reproducing a...

Photolithography apparatus and exposure method

Stamper for producing optical recording medium, optical recording m...