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Shingo Mandai
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Cupertino, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Selection of pulse repetition intervals for sensing time of flight
Patent number
11,500,094
Issue date
Nov 15, 2022
Apple Inc.
Thierry Oggier
G01 - MEASURING TESTING
Information
Patent Grant
SPAD-based photon detectors with multi-phase sampling TDCs
Patent number
11,476,372
Issue date
Oct 18, 2022
Apple Inc.
Shingo Mandai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
SPAD array with gated histogram construction
Patent number
11,415,679
Issue date
Aug 16, 2022
Apple Inc.
Anup K. Sharma
G04 - HOROLOGY
Information
Patent Grant
Back-illuminated single-photon avalanche diode
Patent number
11,271,031
Issue date
Mar 8, 2022
Apple Inc.
Shingo Mandai
G01 - MEASURING TESTING
Information
Patent Grant
Spatial temporal weighting in a SPAD detector
Patent number
10,962,628
Issue date
Mar 30, 2021
Apple Inc.
Moshe Laifenfeld
G01 - MEASURING TESTING
Information
Patent Grant
Management of histogram memory for a single-photon avalanche diode...
Patent number
10,928,492
Issue date
Feb 23, 2021
Apple Inc.
Shingo Mandai
G01 - MEASURING TESTING
Information
Patent Grant
SPAD detector having modulated sensitivity
Patent number
10,801,886
Issue date
Oct 13, 2020
Apple Inc.
Shingo Mandai
G01 - MEASURING TESTING
Information
Patent Grant
Adaptive transmission power control for a LIDAR
Patent number
10,775,507
Issue date
Sep 15, 2020
Apple Inc.
Shingo Mandai
G01 - MEASURING TESTING
Information
Patent Grant
Stacked backside illuminated SPAD array
Patent number
10,658,419
Issue date
May 19, 2020
Apple Inc.
Shingo Mandai
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Signal acquisition in a SPAD detector
Patent number
10,656,251
Issue date
May 19, 2020
Apple Inc.
Shingo Mandai
G01 - MEASURING TESTING
Information
Patent Grant
SPAD array with gated histogram construction
Patent number
10,620,300
Issue date
Apr 14, 2020
Apple Inc.
Anup K. Sharma
G01 - MEASURING TESTING
Information
Patent Grant
Stacked backside illuminated SPAD array
Patent number
10,438,987
Issue date
Oct 8, 2019
Apple Inc.
Shingo Mandai
G01 - MEASURING TESTING
Information
Patent Grant
Spad array with pixel-level bias control
Patent number
9,997,551
Issue date
Jun 12, 2018
Apple Inc.
Shingo Mandai
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Reconfigurable Time of Flight Proximity Sensor with Near-Field and...
Publication number
20230258785
Publication date
Aug 17, 2023
Apple Inc.
Shingo Mandai
G01 - MEASURING TESTING
Information
Patent Application
SPAD-Based Photon Detectors with Multi-Phase Sampling TDCS
Publication number
20230015431
Publication date
Jan 19, 2023
Apple Inc.
Shingo Mandai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Selection of pulse repetition intervals for sensing time of flight
Publication number
20220350026
Publication date
Nov 3, 2022
Apple Inc.
Moshe Laifenfeld
G01 - MEASURING TESTING
Information
Patent Application
Time-of-flight depth sensing with improved linearity
Publication number
20220244391
Publication date
Aug 4, 2022
Apple Inc.
Shingo Mandai
G01 - MEASURING TESTING
Information
Patent Application
Transistor Integration with Stacked Single-Photon Avalanche Diode (...
Publication number
20220102404
Publication date
Mar 31, 2022
Apple Inc.
Hong Wei Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Selection of pulse repetition intervals for sensing time of flight
Publication number
20200386890
Publication date
Dec 10, 2020
Apple Inc.
Thierry Oggier
G01 - MEASURING TESTING
Information
Patent Application
Back-Illuminated Single-Photon Avalanche Diode
Publication number
20200286946
Publication date
Sep 10, 2020
Apple Inc.
Shingo Mandai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Management of Histogram Memory for a Single-Photon Avalanche Diode...
Publication number
20200278429
Publication date
Sep 3, 2020
Apple Inc.
Shingo Mandai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SPAD array with gated histogram construction
Publication number
20200158837
Publication date
May 21, 2020
Apple Inc.
Anup K. Sharma
G01 - MEASURING TESTING
Information
Patent Application
EARLY-LATE PULSE COUNTING FOR LIGHT EMITTING DEPTH SENSORS
Publication number
20190018119
Publication date
Jan 17, 2019
Apple Inc.
Moshe Laifenfeld
G01 - MEASURING TESTING
Information
Patent Application
SPAD Detector Having Modulated Sensitivity
Publication number
20180209846
Publication date
Jul 26, 2018
Apple Inc.
Shingo Mandai
G01 - MEASURING TESTING
Information
Patent Application
Stacked Backside Illuminated SPAD Array
Publication number
20180090526
Publication date
Mar 29, 2018
Apple Inc.
Shingo Mandai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Stacked Backside Illuminated SPAD Array
Publication number
20180090536
Publication date
Mar 29, 2018
Apple Inc.
Shingo Mandai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Adaptive transmission power control for a LIDAR
Publication number
20180081061
Publication date
Mar 22, 2018
Apple Inc.
Shingo Mandai
G02 - OPTICS
Information
Patent Application
SPAD ARRAY WITH PIXEL-LEVEL BIAS CONTROL
Publication number
20170179173
Publication date
Jun 22, 2017
Apple Inc.
Shingo Mandai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SPAD array with gated histogram construction
Publication number
20170052065
Publication date
Feb 23, 2017
Apple Inc.
Anup K. Sharma
G01 - MEASURING TESTING