Shingo Nakamura

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Aichi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Abnormal measurement detection device and method for infrared radia...
- Patent number 9,163,992
- Issue date Oct 20, 2015
- Toyota Jidosha Kabushiki Kaisha
- Yuichi Furukawa
- G01 - MEASURING TESTING
Information Patent Grant
Abnormal measurement detection device and method for infrared radia...
- Patent number 8,445,847
- Issue date May 21, 2013
- Toyota Jidosha Kabushiki Kaisha
- Yuichi Furukawa
- G01 - MEASURING TESTING
Information Patent Grant
Temperature measuring device and temperature measuring method
- Patent number 8,340,468
- Issue date Dec 25, 2012
- Toyota Jidosha Kabushiki Kaisha
- Yuichi Furukawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ABNORMAL MEASUREMENT DETECTION DEVICE AND METHOD FOR INFRARED RADIA...
- Publication number 20130021601
- Publication date Jan 24, 2013
- MEIWA E-TEC CO., LTD.
- Yuichi FURUKAWA
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE MEASURING DEVICE AND TEMPERATURE MEASURING METHOD
- Publication number 20100098321
- Publication date Apr 22, 2010
- TOYOTA JIDOSHA KABUSHIKI KAISHA
- Yuichi Furukawa
- G01 - MEASURING TESTING
Information Patent Application
ABNORMAL MEASUREMENT DETECTION DEVICE AND METHOD FOR INFRARED RADIA...
- Publication number 20100073670
- Publication date Mar 25, 2010
- Yuichi Furukawa
- G01 - MEASURING TESTING