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Shingo Nihommori
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Himeji-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Photoelectric encoder
Patent number
7,570,433
Issue date
Aug 4, 2009
Mitutoyo Corporation
Toshitaka Shimomura
G01 - MEASURING TESTING
Information
Patent Grant
Optical configuration for imaging-type optical encoders
Patent number
7,435,945
Issue date
Oct 14, 2008
Mitutoyo Corporation
Toshitaka Shimomura
G01 - MEASURING TESTING
Information
Patent Grant
Displacement detector
Patent number
7,394,550
Issue date
Jul 1, 2008
Mitutoyo Corporation
Tomotaka Takahashi
G01 - MEASURING TESTING
Information
Patent Grant
Photoelectric encoder using an incoherent semiconductor light source
Patent number
7,265,338
Issue date
Sep 4, 2007
Mitutoyo Corporation
Tetsuro Kiriyama
G01 - MEASURING TESTING
Information
Patent Grant
Optical configuration for imaging-type optical encoders
Patent number
7,186,969
Issue date
Mar 6, 2007
Mitutoyo Corporation
Toshitaka Shimomura
G01 - MEASURING TESTING
Information
Patent Grant
Optical encoder
Patent number
6,635,863
Issue date
Oct 21, 2003
Mitutoyo Corporation
Shingo Nihommori
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Photoelectric Encoder
Publication number
20070215797
Publication date
Sep 20, 2007
MITUTOYO CORPORATION
Toshitaka Shimomura
G01 - MEASURING TESTING
Information
Patent Application
Optical configuration for imaging-type optical encoders
Publication number
20070018084
Publication date
Jan 25, 2007
Mitutoyo Corporation
Toshitaka Shimomura
G01 - MEASURING TESTING
Information
Patent Application
Displacement detector
Publication number
20060139654
Publication date
Jun 29, 2006
Mitutoyo Corporation
Tomotaka Takahashi
G01 - MEASURING TESTING
Information
Patent Application
Photoelectric encoder
Publication number
20060097141
Publication date
May 11, 2006
Mitutoyo Corporation
Tetsuro Kiriyama
G01 - MEASURING TESTING
Information
Patent Application
Photoelectric encoder
Publication number
20040178333
Publication date
Sep 16, 2004
Mitutoyo Corporation
Toshitaka Shimomura
G01 - MEASURING TESTING
Information
Patent Application
Optical configuration for imaging-type optical encoders
Publication number
20040173737
Publication date
Sep 9, 2004
Mitutoyo Corporation
Toshitaka Shimomura
G01 - MEASURING TESTING