Shingo Sumie

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Kakogawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for measuring semiconductor carrier lifetime
- Patent number 9,279,762
- Issue date Mar 8, 2016
- Kobe Steel, Ltd.
- Kazushi Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for classifying a defect on a semiconductor wafer
- Patent number 5,943,437
- Issue date Aug 24, 1999
- Kabushiki Kaisha Kobe Seiko Sho
- Shingo Sumie
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of and apparatus for determining residual damage to wafer edges
- Patent number 5,790,252
- Issue date Aug 4, 1998
- Shin-Etsu Handotai Co., Ltd.
- Hisashi Masumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of and apparatus for measuring lifetime of carriers in semic...
- Patent number 5,760,597
- Issue date Jun 2, 1998
- Kabushiki Kaisha Kobe Seiko Sho
- Naoyuki Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Method of sample valuation based on the measurement of photothermal...
- Patent number 5,619,326
- Issue date Apr 8, 1997
- Kabushiki Kaisha Kobe Seiko Sho
- Hiroyuki Takamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Sample evaluating method by using thermal expansion displacement
- Patent number 5,298,970
- Issue date Mar 29, 1994
- Kabushiki Kaisha Kobe Seiko Sho
- Hiroyuki Takamatsu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR MEASURING SEMICONDUCTOR CARRIER LIFETIME
- Publication number 20120203473
- Publication date Aug 9, 2012
- KOBELCO RESEARCH INSTITUTE, INC.
- Kazushi Hayashi
- G01 - MEASURING TESTING