TREA

Shingo Tanaka

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  • Hitachinaka, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Optical defect inspection apparatus
    • Patent number 7,894,052
    • Issue date Feb 22, 2011
    • Hitachi High-Technologies Corporation
    • Noriyuki Aizawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Optical defect inspection apparatus
    • Patent number 7,746,461
    • Issue date Jun 29, 2010
    • Hitachi High-Technologies Corporation
    • Noriyuki Aizawa
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    OPTICAL DEFECT INSPECTION APPARATUS
    • Publication number 20120182547
    • Publication date Jul 19, 2012
    • Hitachi High-Technologies Corporation
    • Noriyuki Aizawa
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL DEFECT INSPECTION APPARATUS
    • Publication number 20110102781
    • Publication date May 5, 2011
    • HITACHI HIGH-TECHNOLOGIES, CORP.
    • Noriyuki AIZAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL DEFECT INSPECTION APPARATUS
    • Publication number 20100231900
    • Publication date Sep 16, 2010
    • Hitachi High-Technologies Corporation
    • Noriyuki AIZAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL DEFECT INSPECTION APPARATUS
    • Publication number 20100141936
    • Publication date Jun 10, 2010
    • HITACHI HIGH-TECHNOLOGIES, CORP.
    • Noriyuki AIZAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL DEFECT INSPECTION APPARATUS
    • Publication number 20090147246
    • Publication date Jun 11, 2009
    • Hitachi High-Technologies Corporation
    • Noriyuki AIZAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Optical defect inspection apparatus
    • Publication number 20070211241
    • Publication date Sep 13, 2007
    • Noriyuki Aizawa
    • G01 - MEASURING TESTING