TREA

SHINGO TOMOHISA

Follow

Person

  • HYOGO, JP
People

Patents Grantslast 30 patents

  • Information Patent Grant

    Silicon carbide semiconductor device and power converter
    • Patent number 12,057,496
    • Issue date Aug 6, 2024
    • Mitsubishi Electric Corporation
    • Yuichi Nagahisa
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Semiconductor substrate
    • Patent number 10,720,374
    • Issue date Jul 21, 2020
    • Mitsubishi Electric Corporation
    • Tomohiro Shinagawa
    • C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
  • Information Patent Grant

    Magnetic field detection device
    • Patent number 8,378,674
    • Issue date Feb 19, 2013
    • Mitsubishi Electric Corporation
    • Taisuke Furukawa
    • B82 - NANO-TECHNOLOGY
  • Information Patent Grant

    Electronic device manufacturing method
    • Patent number 6,898,851
    • Issue date May 31, 2005
    • Renesas Technology Corp.
    • Yasutaka Nishioka
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    System for manufacturing a semiconductor device
    • Patent number 6,273,954
    • Issue date Aug 14, 2001
    • Mitsubishi Denki Kabushiki Kaisha
    • Kazuyasu Nishikawa
    • C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

  • Information Patent Application

    SILICON CARBIDE SEMICONDUCTOR DEVICE AND POWER CONVERTER
    • Publication number 20220254906
    • Publication date Aug 11, 2022
    • Mitsubishi Electric Corporation
    • Yuichi NAGAHISA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR SUBSTRATE
    • Publication number 20190252288
    • Publication date Aug 15, 2019
    • MITSUBISHI ELECTRIC CORPORATION
    • Tomohiro SHINAGAWA
    • C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
  • Information Patent Application

    MAGNETIC FIELD DETECTION DEVICE
    • Publication number 20100156405
    • Publication date Jun 24, 2010
    • Mitsubishi Electric Corporation
    • Taisuke Furukawa
    • G01 - MEASURING TESTING
  • Information Patent Application

    Electronic device manufacturing method
    • Publication number 20040163246
    • Publication date Aug 26, 2004
    • Renesas Technology Corp.
    • Yasutaka Nishioka
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Semiconductor device with multilayer interconnection structure
    • Publication number 20030222349
    • Publication date Dec 4, 2003
    • Mitsubishi Denki Kabushiki Kaisha
    • Shingo Tomohisa
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Plasma processing apparatus
    • Publication number 20020088542
    • Publication date Jul 11, 2002
    • Kazuyasu Nishikawa
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SYSTEM FOR MANUFACTURING A SEMICONDUCTOR DEVICE
    • Publication number 20010002581
    • Publication date Jun 7, 2001
    • KAZUYASU NISHIKAWA
    • C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...