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Shingo Yorisaki
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Hachioji, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Manufacturing method of semiconductor integrated circuit device
Patent number
8,357,933
Issue date
Jan 22, 2013
Renesas Electronics Corporation
Akio Hasebe
G01 - MEASURING TESTING
Information
Patent Grant
Fabrication method of semiconductor integrated circuit device
Patent number
7,901,958
Issue date
Mar 8, 2011
Renesas Electronics Corporation
Masayoshi Okamoto
G01 - MEASURING TESTING
Information
Patent Grant
Manufacturing method of semiconductor integrated circuit device
Patent number
7,776,626
Issue date
Aug 17, 2010
Renesas Technology Corp.
Akio Hasebe
G01 - MEASURING TESTING
Information
Patent Grant
Manufacturing method of semiconductor integrated circuit device
Patent number
7,598,100
Issue date
Oct 6, 2009
Renesas Technology Corp.
Hideyuki Matsumoto
G01 - MEASURING TESTING
Information
Patent Grant
Manufacturing method of semiconductor integrated circuit device and...
Patent number
7,517,707
Issue date
Apr 14, 2009
Renesas Technology Corp.
Masayoshi Okamoto
G01 - MEASURING TESTING
Information
Patent Grant
Manufacturing method of semiconductor integrated circuit device
Patent number
7,407,823
Issue date
Aug 5, 2008
Renesas Technology Corp.
Akio Hasebe
G01 - MEASURING TESTING
Information
Patent Grant
Manufacturing method of semiconductor integrated circuit device and...
Patent number
7,271,015
Issue date
Sep 18, 2007
Renesas Technology Corp.
Masayoshi Okamoto
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
Publication number
20110175634
Publication date
Jul 21, 2011
Masayoshi Okamoto
G01 - MEASURING TESTING
Information
Patent Application
FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
Publication number
20110136272
Publication date
Jun 9, 2011
Masayoshi Okamoto
G01 - MEASURING TESTING
Information
Patent Application
FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
Publication number
20100304510
Publication date
Dec 2, 2010
Masayoshi Okamoto
G01 - MEASURING TESTING
Information
Patent Application
MANUFACTORING METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
Publication number
20100277192
Publication date
Nov 4, 2010
Renesas Technology Corp.
Akio HASEBE
G01 - MEASURING TESTING
Information
Patent Application
MANUFACTURING METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
Publication number
20090130785
Publication date
May 21, 2009
Hideyuki Matsumoto
G01 - MEASURING TESTING
Information
Patent Application
MANUFACTURING METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
Publication number
20090017565
Publication date
Jan 15, 2009
Akio Hasebe
G01 - MEASURING TESTING
Information
Patent Application
FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
Publication number
20080020498
Publication date
Jan 24, 2008
Masayoshi Okamoto
G01 - MEASURING TESTING
Information
Patent Application
Manufacturing method of semiconductor integrated circuit device and...
Publication number
20070190671
Publication date
Aug 16, 2007
Masayoshi Okamoto
G01 - MEASURING TESTING
Information
Patent Application
Manufacturing method of semiconductor integrated circuit device
Publication number
20060286715
Publication date
Dec 21, 2006
Akio Hasebe
G01 - MEASURING TESTING
Information
Patent Application
Manufacturing method of semiconductor integrated circuit device and...
Publication number
20050227383
Publication date
Oct 13, 2005
Masayoshi Okamoto
G01 - MEASURING TESTING
Information
Patent Application
Fabrication method of semiconductor integrated circuit device
Publication number
20050093565
Publication date
May 5, 2005
Masayoshi Okamoto
G01 - MEASURING TESTING