Shinichi Akiyama

Person

  • Nagoya-shi, JP

Patents Grantslast 30 patents

  • Information Patent Grant

    Method for detecting SLE

    • Patent number 12,366,569
    • Issue date Jul 22, 2025
    • Keio University
    • Akiyoshi Hirayama
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    METHOD FOR DETECTING SLE

    • Publication number 20220120730
    • Publication date Apr 21, 2022
    • KEIO UNIVERSITY
    • Akiyoshi Hirayama
    • G01 - MEASURING TESTING