Shinichi Imai

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Gas analysis device and gas analysis method
- Patent number 9,861,297
- Issue date Jan 9, 2018
- Riken
- Masaki Yumoto
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Pattern inspection apparatus and pattern inspection method
- Patent number 8,649,591
- Issue date Feb 11, 2014
- Kabushiki Kaisha Toshiba
- Makoto Kaneko
- G01 - MEASURING TESTING
Information Patent Grant
Wavelength conversion light source apparatus and wavelength convers...
- Patent number 7,961,378
- Issue date Jun 14, 2011
- Megaopto Co., Ltd
- Shinichi Imai
- G02 - OPTICS
Information Patent Grant
Beam irradiation apparatus with deep ultraviolet light emission dev...
- Patent number 7,781,749
- Issue date Aug 24, 2010
- Advanced Mask Inspection Technology, Inc.
- Shinichi Imai
- G01 - MEASURING TESTING
Information Patent Grant
Pattern inspection apparatus
- Patent number 7,656,516
- Issue date Feb 2, 2010
- Advanced Mask Inspection Technology Inc.
- Shinichi Imai
- G01 - MEASURING TESTING
Information Patent Grant
Pattern inspection apparatus
- Patent number 7,495,756
- Issue date Feb 24, 2009
- Advanced Mask Inspection Technology Inc.
- Shinichi Imai
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus having two sensors, method for inspecting an o...
- Patent number 7,304,730
- Issue date Dec 4, 2007
- Kabushiki Kaisha Toshiba
- Hiromu Inoue
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
GAS ANALYSIS DEVICE AND GAS ANALYSIS METHOD
- Publication number 20160331270
- Publication date Nov 17, 2016
- Riken
- Masaki YUMOTO
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD
- Publication number 20120242985
- Publication date Sep 27, 2012
- Kabushiki Kaisha Toshiba
- Mitsutoshi WATABIKI
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD
- Publication number 20120243770
- Publication date Sep 27, 2012
- Kabushiki Kaisha Toshiba
- Makoto Kaneko
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD
- Publication number 20120242995
- Publication date Sep 27, 2012
- Kabushiki Kaisha Toshiba
- Yusaku KONNO
- G01 - MEASURING TESTING
Information Patent Application
WAVELENGTH CONVERSION LIGHT SOURCE APPARATUS AND WAVELENGTH CONVERS...
- Publication number 20100128343
- Publication date May 27, 2010
- Advanced Mask Inspection Technology, Inc.
- Shinichi IMAI
- G02 - OPTICS
Information Patent Application
BEAM IRRADIATION APPARATUS WITH DEEP ULTRAVIOLET LIGHT EMISSION DEV...
- Publication number 20090084989
- Publication date Apr 2, 2009
- Advanced Mask Inspection Technology Inc.
- Shinichi Imai
- G01 - MEASURING TESTING
Information Patent Application
Inspection apparatus having two sensors, method for inspecting an o...
- Publication number 20080030719
- Publication date Feb 7, 2008
- Hiromu Inoue
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION APPARATUS
- Publication number 20080013072
- Publication date Jan 17, 2008
- Advanced Mask Inspection Technology Inc.
- Shinichi Imai
- G02 - OPTICS
Information Patent Application
Pattern inspection apparatus
- Publication number 20070064223
- Publication date Mar 22, 2007
- Advanced Mask Inspection Technology Inc.
- Shinichi Imai
- G02 - OPTICS
Information Patent Application
Deep ultraviolet laser apparatus
- Publication number 20070064750
- Publication date Mar 22, 2007
- Megaopto Co., Ltd.
- Yushi Kaneda
- G02 - OPTICS
Information Patent Application
Deep ultraviolet laser apparatus
- Publication number 20070064749
- Publication date Mar 22, 2007
- Megaopto Co., Ltd.
- Yushi Kaneda
- G02 - OPTICS
Information Patent Application
Image input apparatus and inspection apparatus
- Publication number 20050196059
- Publication date Sep 8, 2005
- Hiromu Inoue
- G01 - MEASURING TESTING
Information Patent Application
Inspection apparatus having two sensors, method for inspecting an o...
- Publication number 20050002020
- Publication date Jan 6, 2005
- Hiromu Inoue
- G01 - MEASURING TESTING

Shinichi Imai

Person

Patents Grantslast 30 patents

Gas analysis device and gas analysis method

Pattern inspection apparatus and pattern inspection method

Wavelength conversion light source apparatus and wavelength convers...

Beam irradiation apparatus with deep ultraviolet light emission dev...

Pattern inspection apparatus

Pattern inspection apparatus

Inspection apparatus having two sensors, method for inspecting an o...

Patents Applicationslast 30 patents

GAS ANALYSIS DEVICE AND GAS ANALYSIS METHOD

PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD

PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD

PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD

WAVELENGTH CONVERSION LIGHT SOURCE APPARATUS AND WAVELENGTH CONVERS...

BEAM IRRADIATION APPARATUS WITH DEEP ULTRAVIOLET LIGHT EMISSION DEV...

Inspection apparatus having two sensors, method for inspecting an o...

PATTERN INSPECTION APPARATUS

Pattern inspection apparatus

Deep ultraviolet laser apparatus

Deep ultraviolet laser apparatus

Image input apparatus and inspection apparatus

Inspection apparatus having two sensors, method for inspecting an o...