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Shinichi Nakamura
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Kawaguchi, JP
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last 30 patents
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Patent Grant
Exposure condition measurement method
Patent number
5,434,026
Issue date
Jul 18, 1995
Nikon Corporation
Norihiko Takatsu
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
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Patent Grant
Projection exposure apparatus
Patent number
4,931,830
Issue date
Jun 5, 1990
Nikon Corporation
Kyoichi Suwa
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY