Shinichi Nakamura

Person

  • Kawaguchi, JP

Patents Grantslast 30 patents

  • Information Patent Grant

    Exposure condition measurement method

    • Patent number 5,434,026
    • Issue date Jul 18, 1995
    • Nikon Corporation
    • Norihiko Takatsu
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Grant

    Projection exposure apparatus

    • Patent number 4,931,830
    • Issue date Jun 5, 1990
    • Nikon Corporation
    • Kyoichi Suwa
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY