Shin'ichi Nakano

Follow

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Waveform measuring apparatus for measuring waveform data and writin...
- Patent number 7,246,017
- Issue date Jul 17, 2007
- Yokogawa Electric Corporation
- Shin'ichi Nakano
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Waveform measuring apparatus
- Publication number 20050234665
- Publication date Oct 20, 2005
- YOKOGAWA ELECTRIC CORPORATION
- Shin'ichi Nakano
- G01 - MEASURING TESTING