Shinichi Okada

Person

Chiyoda-ku, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Transmission system, antenna, control device, and transmission method
- Patent number 11,929,771
- Issue date Mar 12, 2024
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Satoshi Kaga
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Electron beam irradiation apparatus and electron beam alignment method
- Patent number 11,515,118
- Issue date Nov 29, 2022
- Ebara Corporation
- Kenji Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle multi-beam device
- Patent number 11,322,335
- Issue date May 3, 2022
- Ebara Corporation
- Shinichi Okada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wireless reading system, shopping assistance system with the same,...
- Patent number 11,205,166
- Issue date Dec 21, 2021
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Koji Imamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Power supply device
- Patent number 11,172,573
- Issue date Nov 9, 2021
- Mitsubishi Electric Corporation
- Takashi Miyamoto
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Wien filter and electron-optics apparatus
- Patent number 11,131,826
- Issue date Sep 28, 2021
- Ebara Corporation
- Shinichi Okada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wireless communications system and method for controlling communica...
- Patent number 10,769,917
- Issue date Sep 8, 2020
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Koji Imamura
- G08 - SIGNALLING
Information Patent Grant
Electron-beam irradiated area adjustment method and adjustment syst...
- Patent number 10,446,404
- Issue date Oct 15, 2019
- Ebara Corporation
- Ryo Tajima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stator of rotary electric machine and rotary electric machine
- Patent number 10,110,083
- Issue date Oct 23, 2018
- Mitsubishi Electric Corporation
- Manabu Yoshinori
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Insulation inspection device for motors and insulation inspection m...
- Patent number 9,797,955
- Issue date Oct 24, 2017
- Mitsubishi Electric Corporation
- Shinichi Okada
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Displacement detector, displacement detection apparatus, displaceme...
- Patent number 8,441,339
- Issue date May 14, 2013
- Uchimura Co., Ltd.
- Shinichi Okada
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam reflector device and electron microscope
- Patent number 7,902,504
- Issue date Mar 8, 2011
- Kabushiki Kaisha Topcon
- Hirotami Koike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 7,592,604
- Issue date Sep 22, 2009
- Topcon Corporation
- Hirotami Koike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam system and electron beam measuring and observing methods
- Patent number 7,329,867
- Issue date Feb 12, 2008
- Topcon Corporation
- Nobuo Kochi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam system and electron beam measuring and observing methods
- Patent number 7,151,258
- Issue date Dec 19, 2006
- Topcon Corporation
- Nobuo Kochi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
TRANSMISSION SYSTEM, ANTENNA, CONTROL DEVICE, AND TRANSMISSION METHOD
- Publication number 20220209799
- Publication date Jun 30, 2022
- Panasonic Intellectual Property Management Co., Ltd.
- Satoshi KAGA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
CHARGED PARTICLE MULTI-BEAM DEVICE
- Publication number 20200279718
- Publication date Sep 3, 2020
- EBARA CORPORATION
- Shinichi OKADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM IRRADIATION APPARATUS AND ELECTRON BEAM ALIGNMENT METHOD
- Publication number 20200273658
- Publication date Aug 27, 2020
- EBARA CORPORATION
- Kenji WATANABE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SHOPPING ASSISTANCE SYSTEM, SHOPPING ASSISTANCE METHOD, AND PROGRAM
- Publication number 20200242580
- Publication date Jul 30, 2020
- Panasonic Intellectual Property Management Co., Ltd.
- Koji IMAMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POWER SUPPLY DEVICE
- Publication number 20200060023
- Publication date Feb 20, 2020
- MITSUBISHI ELECTRIC CORPORATION
- Takashi MIYAMOTO
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
INFORMATION ACQUISITION SYSTEM, SHOPPING ASSISTANCE SYSTEM, INFORMA...
- Publication number 20190362109
- Publication date Nov 28, 2019
- Panasonic Intellectual Property Management Co., Ltd.
- Suguru KOJIMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WIRELESS COMMUNICATIONS SYSTEM AND METHOD FOR CONTROLLING COMMUNICA...
- Publication number 20190325723
- Publication date Oct 24, 2019
- Panasonic Intellectual Property Management Co., Ltd.
- Koji IMAMURA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
DEMAND PREDICTION SYSTEM, DEMAND PREDICTION METHOD, AND PROGRAM
- Publication number 20190311385
- Publication date Oct 10, 2019
- Panasonic Intellectual Property Management Co., Ltd.
- Kenichi KAWAGUCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SHOPPING ASSISTANCE SYSTEM
- Publication number 20190287354
- Publication date Sep 19, 2019
- Panasonic Intellectual Property Management Co., Ltd.
- KAZUHIKO YAHATA
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
WIEN FILTER AND ELECTRON-OPTICS APPARATUS
- Publication number 20190250361
- Publication date Aug 15, 2019
- EBARA CORPORATION
- Shinichi OKADA
- G02 - OPTICS
Information Patent Application
WIRELESS READING SYSTEM, SHOPPING ASSISTANCE SYSTEM WITH THE SAME,...
- Publication number 20190213572
- Publication date Jul 11, 2019
- Panasonic Intellectual Property Management Co., Ltd.
- Koji IMAMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRON-BEAM IRRADIATED AREA ADJUSTMENT METHOD AND ADJUSTMENT SYST...
- Publication number 20180233374
- Publication date Aug 16, 2018
- EBARA CORPORATION
- Ryo TAJIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STATOR OF ROTARY ELECTRIC MACHINE AND ROTARY ELECTRIC MACHINE
- Publication number 20160172921
- Publication date Jun 16, 2016
- Mitsubishi Electric Corporation
- Manabu YOSHINORI
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
INSULATION INSPECTION DEVICE FOR MOTORS AND INSULATION INSPECTION M...
- Publication number 20150247901
- Publication date Sep 3, 2015
- MITSUBISHI ELECTRIC CORPORATION
- Shinichi Okada
- G01 - MEASURING TESTING
Information Patent Application
Displacement Detector, Displacement Detection Apparatus, Displaceme...
- Publication number 20100308969
- Publication date Dec 9, 2010
- Uchimura Co., Ltd.
- Shinichi OKADA
- G01 - MEASURING TESTING
Information Patent Application
Scanning electron microscope and similar apparatus
- Publication number 20090294665
- Publication date Dec 3, 2009
- Hirotami Koike
- G01 - MEASURING TESTING
Information Patent Application
Charged particle beam reflector device and electron microscope
- Publication number 20090095904
- Publication date Apr 16, 2009
- Kabushiki Kaisha TOPCON
- Hirotami Koike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam apparatus
- Publication number 20070246651
- Publication date Oct 25, 2007
- Hirotami Koike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron beam system and electron beam measuring and observing methods
- Publication number 20060289757
- Publication date Dec 28, 2006
- TOPCON CORPORATION
- Nobuo Kochi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning electron microscope and similar apparatus
- Publication number 20050279937
- Publication date Dec 22, 2005
- Hirotami Koike
- G01 - MEASURING TESTING
Information Patent Application
Electron beam system and electron beam measuring and observing methods
- Publication number 20050061972
- Publication date Mar 24, 2005
- TOPCON CORPORATION
- Nobuo Kochi
- H01 - BASIC ELECTRIC ELEMENTS

Shinichi Okada

Person

Patents Grantslast 30 patents

Transmission system, antenna, control device, and transmission method

Electron beam irradiation apparatus and electron beam alignment method

Charged particle multi-beam device

Wireless reading system, shopping assistance system with the same,...

Power supply device

Wien filter and electron-optics apparatus

Wireless communications system and method for controlling communica...

Electron-beam irradiated area adjustment method and adjustment syst...

Stator of rotary electric machine and rotary electric machine

Insulation inspection device for motors and insulation inspection m...

Displacement detector, displacement detection apparatus, displaceme...

Charged particle beam reflector device and electron microscope

Charged particle beam apparatus

Electron beam system and electron beam measuring and observing methods

Electron beam system and electron beam measuring and observing methods

Patents Applicationslast 30 patents

TRANSMISSION SYSTEM, ANTENNA, CONTROL DEVICE, AND TRANSMISSION METHOD

CHARGED PARTICLE MULTI-BEAM DEVICE

ELECTRON BEAM IRRADIATION APPARATUS AND ELECTRON BEAM ALIGNMENT METHOD

SHOPPING ASSISTANCE SYSTEM, SHOPPING ASSISTANCE METHOD, AND PROGRAM

POWER SUPPLY DEVICE

INFORMATION ACQUISITION SYSTEM, SHOPPING ASSISTANCE SYSTEM, INFORMA...

WIRELESS COMMUNICATIONS SYSTEM AND METHOD FOR CONTROLLING COMMUNICA...

DEMAND PREDICTION SYSTEM, DEMAND PREDICTION METHOD, AND PROGRAM

SHOPPING ASSISTANCE SYSTEM

WIEN FILTER AND ELECTRON-OPTICS APPARATUS

WIRELESS READING SYSTEM, SHOPPING ASSISTANCE SYSTEM WITH THE SAME,...

ELECTRON-BEAM IRRADIATED AREA ADJUSTMENT METHOD AND ADJUSTMENT SYST...

STATOR OF ROTARY ELECTRIC MACHINE AND ROTARY ELECTRIC MACHINE

INSULATION INSPECTION DEVICE FOR MOTORS AND INSULATION INSPECTION M...

Displacement Detector, Displacement Detection Apparatus, Displaceme...

Scanning electron microscope and similar apparatus

Charged particle beam reflector device and electron microscope

Charged particle beam apparatus

Electron beam system and electron beam measuring and observing methods

Scanning electron microscope and similar apparatus

Electron beam system and electron beam measuring and observing methods