Shinichi Oki

Person

Sakai-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method of testing semiconductor integrated circuits and testing boa...
- Patent number 6,781,400
- Issue date Aug 24, 2004
- Matsushita Electric Industrial Co., Ltd.
- Yoshiro Nakata
- G01 - MEASURING TESTING
Information Patent Grant
Probe card
- Patent number 6,518,779
- Issue date Feb 11, 2003
- Matsushita Electrical Industrial Do., Ltd.
- Yoshiro Nakata
- G01 - MEASURING TESTING
Information Patent Grant
Method of testing semiconductor integrated circuits and testing boa...
- Patent number 6,400,175
- Issue date Jun 4, 2002
- Matsushita Electric Industrial Co., Ltd.
- Yoshiro Nakata
- G01 - MEASURING TESTING
Information Patent Grant
Wafer burn-in cassette and method of manufacturing probe card for u...
- Patent number 6,297,658
- Issue date Oct 2, 2001
- Matsushita Electric Industrial Co., Ltd.
- Yoshiro Nakata
- G01 - MEASURING TESTING
Information Patent Grant
Method of testing electrical characteristics of multiple semiconduc...
- Patent number 6,229,329
- Issue date May 8, 2001
- Matsushita Electric Industrial Co., Ltd.
- Yoshiro Nakata
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing probe card
- Patent number 5,829,126
- Issue date Nov 3, 1998
- Matsushita Electric Industrial Co., Ltd.
- Koichi Nagao
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device checking method
- Patent number 5,665,610
- Issue date Sep 9, 1997
- Matsushita Electric Industrial Co., Ltd.
- Yoshiro Nakata
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting method for semiconductor devices
- Patent number 5,605,844
- Issue date Feb 25, 1997
- Matsushita Electric Industrial Co., Ltd.
- Shinichi Oki
- G01 - MEASURING TESTING
Information Patent Grant
Sound reproducing apparatus
- Patent number 4,972,489
- Issue date Nov 20, 1990
- Matsushita Electric Industrial Co., Ltd.
- Shinichi Oki
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
Method of testing semiconductor integrated circuits and testing boa...
- Publication number 20030090288
- Publication date May 15, 2003
- Matsushita Electric Industrial Co., Ltd.
- Yoshiro Nakata
- G01 - MEASURING TESTING
Information Patent Application
Method of testing semiconductor integrated circuits and testing boa...
- Publication number 20020190743
- Publication date Dec 19, 2002
- Matsushita Electric Industrial Co., Ltd.
- Yoshiro Nakata
- G01 - MEASURING TESTING

Shinichi Oki

Person

Patents Grantslast 30 patents

Method of testing semiconductor integrated circuits and testing boa...

Probe card

Method of testing semiconductor integrated circuits and testing boa...

Wafer burn-in cassette and method of manufacturing probe card for u...

Method of testing electrical characteristics of multiple semiconduc...

Method of manufacturing probe card

Semiconductor device checking method

Inspecting method for semiconductor devices

Sound reproducing apparatus

Patents Applicationslast 30 patents

Method of testing semiconductor integrated circuits and testing boa...

Method of testing semiconductor integrated circuits and testing boa...