Shinichi SHIBAHARA

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device, control system, and control method of semicon...
- Patent number 11,544,192
- Issue date Jan 3, 2023
- Renesas Electronics Corporation
- Yuki Hayakawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device, control system, and control method of semicon...
- Patent number 10,860,486
- Issue date Dec 8, 2020
- Renesas Electronics Corporation
- Yuki Hayakawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor apparatus and diagnostic test method
- Patent number 10,761,139
- Issue date Sep 1, 2020
- Renesas Electronics Corporation
- Shinichi Shibahara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor apparatus and diagnostic test method
- Patent number 10,151,796
- Issue date Dec 11, 2018
- Renesas Electronics Corporation
- Shinichi Shibahara
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE, CONTROL SYSTEM, AND CONTROL METHOD OF SEMICON...
- Publication number 20210089453
- Publication date Mar 25, 2021
- RENESAS ELECTRONICS CORPORATION
- Yuki HAYAKAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE, CONTROL SYSTEM, AND CONTROL METHOD OF SEMICON...
- Publication number 20200073806
- Publication date Mar 5, 2020
- RENESAS ELECTRONICS CORPORATION
- Yuki HAYAKAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR APPARATUS AND DIAGNOSTIC TEST METHOD
- Publication number 20190072611
- Publication date Mar 7, 2019
- Renesas Electronics Corporation
- Shinichi SHIBAHARA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR APPARATUS AND DIAGNOSTIC TEST METHOD
- Publication number 20160349322
- Publication date Dec 1, 2016
- RENESAS ELECTRONICS CORPORATION
- Shinichi SHIBAHARA
- G01 - MEASURING TESTING