Shinichi Tamabayashi

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method of inspecting optical waveguide substrate for optical conduc...
- Patent number 7,106,426
- Issue date Sep 12, 2006
- NEC Toppan Circuit Solutions, Inc.
- Hideo Kikuchi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method of inspecting optical waveguide substrate for optical conduc...
- Publication number 20030117614
- Publication date Jun 26, 2003
- NEC Toppan Circuit Solutions, Inc.
- Hideo Kikuchi
- G01 - MEASURING TESTING