Shinichi Terada

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Uji Kyoto, JP

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Patents Grantslast 30 patents

Information Patent Grant
Pore- or particle-size distribution measurement apparatus
- Patent number 7,609,812
- Issue date Oct 27, 2009
- Technos Co., ltd.
- Shinichi Terada
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescent X-ray spectroscopic apparatus
- Patent number 7,424,092
- Issue date Sep 9, 2008
- Technos Co., ltd.
- Shinichi Terada
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence system with apertured mask for analyzing pattern...
- Patent number 7,023,955
- Issue date Apr 4, 2006
- X-Ray Optical System, Inc.
- Zewu Chen
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analyzing apparatus and x-ray irradiation angle setting method
- Patent number 5,949,847
- Issue date Sep 7, 1999
- Technos Institute Co., Ltd.
- Shinichi Terada
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-ray fluorescence system with apertured mask for analyzing pattern...
- Publication number 20050036583
- Publication date Feb 17, 2005
- X-Ray Optical Systems, Inc.
- Zewu Chen
- G01 - MEASURING TESTING