Shinichi Yamaguchi

Person

Nagaokakyo-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Imaging analysis device and imaging data analysis method
- Patent number 12,190,517
- Issue date Jan 7, 2025
- Shimadzu Corporation
- Shinichi Yamaguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analysis device
- Patent number 12,176,194
- Issue date Dec 24, 2024
- Shimadzu Corporation
- Shinichi Yamaguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Imaging analyzer
- Patent number 12,026,888
- Issue date Jul 2, 2024
- Shimadzu Corporation
- Shinichi Yamaguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Imaging analysis device
- Patent number 11,887,827
- Issue date Jan 30, 2024
- Shimadzu Corporation
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging data processing device
- Patent number 11,861,826
- Issue date Jan 2, 2024
- Shimadzu Corporation
- Shinichi Yamaguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Imaging mass spectrometer
- Patent number 11,862,445
- Issue date Jan 2, 2024
- Shimadzu Corporation
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Data processing device
- Patent number 11,776,799
- Issue date Oct 3, 2023
- Shimadzu Corporation
- Shinichi Yamaguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Imaging data analyzer
- Patent number 11,651,603
- Issue date May 16, 2023
- Shimadzu Corporation
- Shinichi Yamaguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Imaging mass spectrometer and method for imaging mass spectrometry
- Patent number 11,545,348
- Issue date Jan 3, 2023
- Shimadzu Corporation
- Shinichi Yamaguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Imaging mass spectrometry system and analytical method using imagin...
- Patent number 11,469,087
- Issue date Oct 11, 2022
- Shimadzu Corporation
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for imaging mass spectrometry and imaging mass spectrometer
- Patent number 11,380,532
- Issue date Jul 5, 2022
- Shimadzu Corporation
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging mass spectrometer
- Patent number 11,282,686
- Issue date Mar 22, 2022
- Shimadzu Corporation
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging mass spectrometric data analyzer
- Patent number 11,282,683
- Issue date Mar 22, 2022
- Shimadzu Corporation
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging data processing device
- Patent number 11,276,566
- Issue date Mar 15, 2022
- Shimadzu Corporation
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Data processing device
- Patent number 11,222,773
- Issue date Jan 11, 2022
- Shimadzu Corporation
- Shinichi Yamaguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data analyzer for chromatograph mass spectrometry
- Patent number 11,215,589
- Issue date Jan 4, 2022
- Shimadzu Corporation
- Shinichi Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Imaging mass spectrometry data processing device
- Patent number 11,211,235
- Issue date Dec 28, 2021
- Shimadzu Corporation
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging mass spectrometry data processing device
- Patent number 11,201,042
- Issue date Dec 14, 2021
- Shimadzu Corporation
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tandem mass spectrometry data processing system
- Patent number 11,145,498
- Issue date Oct 12, 2021
- Shimadzu Corporation
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multidimensional mass spectrometry data processing device
- Patent number 10,818,485
- Issue date Oct 27, 2020
- Shimadzu Corporation
- Shinichi Yamaguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analyzing apparatus
- Patent number 10,763,094
- Issue date Sep 1, 2020
- Shimadzu Corporation
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multilayer ceramic capacitor
- Patent number 10,650,976
- Issue date May 12, 2020
- Murata Manufacturing Co., Ltd.
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multilayer ceramic capacitor
- Patent number 10,468,192
- Issue date Nov 5, 2019
- Murata Manufacturing Co., Ltd.
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement error correction method based on temperature-dependent...
- Patent number 10,438,781
- Issue date Oct 8, 2019
- Shimadzu Corporation
- Shinichi Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Measurement error correction method based on temperature-dependent...
- Patent number 10,395,906
- Issue date Aug 27, 2019
- Shimadzu Corporation
- Shinichi Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometer
- Patent number 10,395,909
- Issue date Aug 27, 2019
- Shimadzu Corporation
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multilayer ceramic capacitor and method for producing the same
- Patent number 10,312,023
- Issue date Jun 4, 2019
- MURATA MANUFACTURING CO., LTD.
- Akitaka Doi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multilayer ceramic capacitor and method for producing the same
- Patent number 10,283,272
- Issue date May 7, 2019
- MURATA MANUFACTURING CO., LTD.
- Akitaka Doi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Data processing system for comprehensive two-dimensional chromatograph
- Patent number 10,254,258
- Issue date Apr 9, 2019
- Shimadzu Corporation
- Shinichi Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Tandem mass spectrometry data processing system
- Patent number 10,249,480
- Issue date Apr 2, 2019
- Shimadzu Corporation
- Shinichi Yamaguchi
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Mass Spectrometry Data Analysis Method and Imaging Mass Spectrometer
- Publication number 20240387158
- Publication date Nov 21, 2024
- Shimadzu Corporation
- Shinichi YAMAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONIC COMPONENT
- Publication number 20240304388
- Publication date Sep 12, 2024
- Murata Manufacturing Co., Ltd.
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONIC COMPONENT
- Publication number 20240304393
- Publication date Sep 12, 2024
- Murata Manufacturing Co., Ltd.
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometry Data Analysis Method and Imaging Mass Spectrometer
- Publication number 20240282561
- Publication date Aug 22, 2024
- Shimadzu Corporation
- Shinichi YAMAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGING ANALYSIS DEVICE AND IMAGING DATA ANALYSIS METHOD
- Publication number 20240153086
- Publication date May 9, 2024
- SHIMADZU CORPORATION
- Shinichi YAMAGUCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTILAYER CERAMIC CAPACITOR
- Publication number 20240006124
- Publication date Jan 4, 2024
- Murata Manufacturing Co., Ltd.
- SHINICHI YAMAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DATA-ANALYZING METHOD, DATA-ANALYZING DEVICE, AND SAMPLE ANALYZER
- Publication number 20230335221
- Publication date Oct 19, 2023
- Shimadzu Corporation
- Ikuko YAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTILAYER CERAMIC CAPACITOR AND METHOD FOR PRODUCING THE SAME
- Publication number 20230046574
- Publication date Feb 16, 2023
- Murata Manufacturing Co., Ltd.
- SHINICHI YAMAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYSIS DEVICE
- Publication number 20220359176
- Publication date Nov 10, 2022
- SHIMADZU CORPORATION
- Shinichi YAMAGUCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGING MASS SPECTROMETER
- Publication number 20220189751
- Publication date Jun 16, 2022
- SHIMADZU CORPORATION
- Shinichi YAMAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGING MASS SPECTROMETER
- Publication number 20220172937
- Publication date Jun 2, 2022
- SHIMADZU CORPORATION
- Shinichi YAMAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGING ANALYSIS DEVICE
- Publication number 20220172936
- Publication date Jun 2, 2022
- SHIMADZU CORPORATION
- Shinichi YAMAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DATA PROCESSING DEVICE
- Publication number 20220059331
- Publication date Feb 24, 2022
- Shimadzu Corporation
- Shinichi YAMAGUCHI
- G01 - MEASURING TESTING
Information Patent Application
IMAGING MASS SPECTROMETER
- Publication number 20220051884
- Publication date Feb 17, 2022
- SHIMADZU CORPORATION
- Shinichi YAMAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGING DATA ANALYZER
- Publication number 20220044003
- Publication date Feb 10, 2022
- SHIMADZU CORPORATION
- Shinichi YAMAGUCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGING ANALYZER
- Publication number 20220044409
- Publication date Feb 10, 2022
- SHIMADZU CORPORATION
- Shinichi YAMAGUCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR IMAGING MASS SPECTROMETRY AND IMAGING MASS SPECTROMETER
- Publication number 20210398787
- Publication date Dec 23, 2021
- Shimadzu Corporation
- Shinichi YAMAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGING MASS SPECTROMETER AND METHOD FOR IMAGING MASS SPECTROMETRY
- Publication number 20210391160
- Publication date Dec 16, 2021
- Shimadzu Corporation
- Shinichi YAMAGUCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGING MASS SPECTROMETER
- Publication number 20210384020
- Publication date Dec 9, 2021
- SHIMADZU CORPORATION
- Shinichi YAMAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGING DATA PROCESSING DEVICE
- Publication number 20210302369
- Publication date Sep 30, 2021
- SHIMADZU CORPORATION
- Shinichi YAMAGUCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGING MASS SPECTROMETRY SYSTEM AND ANALYTICAL METHOD USING IMAGIN...
- Publication number 20210296104
- Publication date Sep 23, 2021
- Shimadzu Corporation
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGING MASS SPECTROMETRY DATA PROCESSING DEVICE
- Publication number 20210242004
- Publication date Aug 5, 2021
- SHIMADZU CORPORATION
- Shinichi YAMAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGING MASS SPECTROMETRY DATA PROCESSING DEVICE
- Publication number 20210225626
- Publication date Jul 22, 2021
- SHIMADZU CORPORATION
- Shinichi YAMAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGING DATA PROCESSING DEVICE
- Publication number 20210210318
- Publication date Jul 8, 2021
- SHIMADZU CORPORATION
- Shinichi YAMAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY DATA ANALYSIS DEVICE, MASS SPECTROMETRY DEVICE, M...
- Publication number 20210166928
- Publication date Jun 3, 2021
- Shimadzu Corporation
- Hidenori TAKAHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGING MASS SPECTROMETRIC DATA ANALYZER
- Publication number 20210020420
- Publication date Jan 21, 2021
- SHIMADZU CORPORATION
- Shinichi YAMAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DATA ANALYSIS DEVICE AND DATA ANALYSIS SYSTEM
- Publication number 20200357122
- Publication date Nov 12, 2020
- SHIMADZU CORPORATION
- Shinichi YAMAGUCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHROMATOGRAM DATA PROCESSING DEVICE
- Publication number 20200088700
- Publication date Mar 19, 2020
- SHIMADZU CORPORATION
- Shinichi YAMAGUCHI
- G01 - MEASURING TESTING
Information Patent Application
MULTILAYER CERAMIC CAPACITOR
- Publication number 20200020484
- Publication date Jan 16, 2020
- Murata Manufacturing Co., Ltd.
- SHINICHI YAMAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DATA ANALYZER FOR CHROMATOGRAPH MASS SPECTROMETRY
- Publication number 20190277817
- Publication date Sep 12, 2019
- SHIMADZU CORPORATION
- Shinichi YAMAGUCHI
- G06 - COMPUTING CALCULATING COUNTING

Shinichi Yamaguchi

Person

Patents Grantslast 30 patents

Imaging analysis device and imaging data analysis method

Analysis device

Imaging analyzer

Imaging analysis device

Imaging data processing device

Imaging mass spectrometer

Data processing device

Imaging data analyzer

Imaging mass spectrometer and method for imaging mass spectrometry

Imaging mass spectrometry system and analytical method using imagin...

Method for imaging mass spectrometry and imaging mass spectrometer

Imaging mass spectrometer

Imaging mass spectrometric data analyzer

Imaging data processing device

Data processing device

Data analyzer for chromatograph mass spectrometry

Imaging mass spectrometry data processing device

Imaging mass spectrometry data processing device

Tandem mass spectrometry data processing system

Multidimensional mass spectrometry data processing device

Analyzing apparatus

Multilayer ceramic capacitor

Multilayer ceramic capacitor

Measurement error correction method based on temperature-dependent...

Measurement error correction method based on temperature-dependent...

Mass spectrometer

Multilayer ceramic capacitor and method for producing the same

Multilayer ceramic capacitor and method for producing the same

Data processing system for comprehensive two-dimensional chromatograph

Tandem mass spectrometry data processing system

Patents Applicationslast 30 patents

Mass Spectrometry Data Analysis Method and Imaging Mass Spectrometer

ELECTRONIC COMPONENT

ELECTRONIC COMPONENT

Mass Spectrometry Data Analysis Method and Imaging Mass Spectrometer

IMAGING ANALYSIS DEVICE AND IMAGING DATA ANALYSIS METHOD

MULTILAYER CERAMIC CAPACITOR

DATA-ANALYZING METHOD, DATA-ANALYZING DEVICE, AND SAMPLE ANALYZER

MULTILAYER CERAMIC CAPACITOR AND METHOD FOR PRODUCING THE SAME

ANALYSIS DEVICE

IMAGING MASS SPECTROMETER

IMAGING MASS SPECTROMETER

IMAGING ANALYSIS DEVICE

DATA PROCESSING DEVICE

IMAGING MASS SPECTROMETER

IMAGING DATA ANALYZER

IMAGING ANALYZER

METHOD FOR IMAGING MASS SPECTROMETRY AND IMAGING MASS SPECTROMETER

IMAGING MASS SPECTROMETER AND METHOD FOR IMAGING MASS SPECTROMETRY

IMAGING MASS SPECTROMETER

IMAGING DATA PROCESSING DEVICE

IMAGING MASS SPECTROMETRY SYSTEM AND ANALYTICAL METHOD USING IMAGIN...

IMAGING MASS SPECTROMETRY DATA PROCESSING DEVICE

IMAGING MASS SPECTROMETRY DATA PROCESSING DEVICE

IMAGING DATA PROCESSING DEVICE

MASS SPECTROMETRY DATA ANALYSIS DEVICE, MASS SPECTROMETRY DEVICE, M...

IMAGING MASS SPECTROMETRIC DATA ANALYZER

DATA ANALYSIS DEVICE AND DATA ANALYSIS SYSTEM

CHROMATOGRAM DATA PROCESSING DEVICE

MULTILAYER CERAMIC CAPACITOR

DATA ANALYZER FOR CHROMATOGRAPH MASS SPECTROMETRY