Shinichiro Aoshima

Person

Shizuoka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Optical amplifying device
- Patent number 8,947,771
- Issue date Feb 3, 2015
- Hamamatsu Photonics K.K.
- Koei Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser beam working machine
- Patent number 8,872,067
- Issue date Oct 28, 2014
- Hamamatsu Photonics K.K.
- Kenshi Fukumitsu
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Laser beam working machine
- Patent number 8,841,580
- Issue date Sep 23, 2014
- Hamamatsu Photonics K.K.
- Kenshi Fukumitsu
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Single terahertz wave time-waveform measuring device
- Patent number 8,742,353
- Issue date Jun 3, 2014
- Hamamatsu Photonics K.K.
- Yoichi Kawada
- G01 - MEASURING TESTING
Information Patent Grant
Total reflection terahertz wave measurement device
- Patent number 8,415,625
- Issue date Apr 9, 2013
- Hamamatsu Photonics K.K.
- Atsushi Nakanishi
- G01 - MEASURING TESTING
Information Patent Grant
Total reflection tera hertz wave measuring apparatus
- Patent number 8,354,644
- Issue date Jan 15, 2013
- Hamamatsu Photonics K.K.
- Takashi Yasuda
- G01 - MEASURING TESTING
Information Patent Grant
Image pickup device
- Patent number 7,046,360
- Issue date May 16, 2006
- Hamamatsu Photonics K.K.
- Masatoshi Fujimoto
- G02 - OPTICS
Information Patent Grant
Light track observing device
- Patent number 7,046,365
- Issue date May 16, 2006
- Hamamatsu Photonics K.K.
- Shinichiro Aoshima
- G01 - MEASURING TESTING
Information Patent Grant
Instrument for measuring lifetime of fluorescene
- Patent number 7,002,162
- Issue date Feb 21, 2006
- Hamamatsu Photonics K.K.
- Masatoshi Fujimoto
- G01 - MEASURING TESTING
Information Patent Grant
Transparent medium processing device
- Patent number 6,707,021
- Issue date Mar 16, 2004
- Hamamatsu Photonics K.K.
- Masatoshi Fujimoto
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Ultrashort pulse laser apparatus
- Patent number 5,815,519
- Issue date Sep 29, 1998
- Hamamatsu Photonics, K.K.
- Shinichiro Aoshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical delay apparatus
- Patent number 5,751,419
- Issue date May 12, 1998
- Hamamatsu Photonics K.K.
- Hironori Takahashi
- G02 - OPTICS
Information Patent Grant
Voltage detection apparatus
- Patent number 5,703,491
- Issue date Dec 30, 1997
- Hamamatsu Photonics K.K.
- Takuya Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic apparatus for measuring an electric field of a sample
- Patent number 5,592,101
- Issue date Jan 7, 1997
- Hamamatsu Photonics K.K.
- Hironori Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Liquid treating method and liquid treating apparatus
- Patent number 5,585,044
- Issue date Dec 17, 1996
- Hamamatsu Photonics K.K.
- Tomonori Kawakami
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Voltage detection apparatus
- Patent number 5,583,444
- Issue date Dec 10, 1996
- Hamamatsu Photonics K.K.
- Takuya Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Method of positioning an electrooptic probe of an apparatus for the...
- Patent number 5,552,716
- Issue date Sep 3, 1996
- Hamamatsu Photonics K.K.
- Hironori Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Voltage measuring apparatus
- Patent number 5,546,011
- Issue date Aug 13, 1996
- Hamamatsu Photonics K.K.
- Hironori Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
E-O probe
- Patent number 5,500,587
- Issue date Mar 19, 1996
- Hamamatsu Photonics K.K.
- Hironori Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
System for measuring timing relationship between two signals
- Patent number 5,499,190
- Issue date Mar 12, 1996
- Hamamatsu Photonics K.K.
- Hironori Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic voltage detector
- Patent number 5,479,106
- Issue date Dec 26, 1995
- Hamamatsu Photonics K.K.
- Hironori Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Voltage measuring apparatus having an electro-optic member
- Patent number 5,444,365
- Issue date Aug 22, 1995
- Hamamatsu Photonics K.K.
- Hironori Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Polarization interferometer optical voltage detector utilizing move...
- Patent number 5,420,686
- Issue date May 30, 1995
- Hamamatsu Photonics K.K.
- Hironori Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Sampling-type optical voltage detector utilizing movement of interf...
- Patent number 5,384,638
- Issue date Jan 24, 1995
- Hamamatsu Photonics K.K.
- Hironori Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Near field scanning optical microscope
- Patent number 5,382,789
- Issue date Jan 17, 1995
- Hamamatsu Photonics K.K.
- Shinichiro Aoshima
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Wavelength variable laser device
- Patent number 5,357,532
- Issue date Oct 18, 1994
- Hamamatsu Photonics K.K.
- Shinichiro Aoshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Light pulse intensity regenerator, light tranforming repeater, pre-...
- Patent number 5,350,913
- Issue date Sep 27, 1994
- Hamamatsu Photonics K.K.
- Shinichiro Aoshima
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Pulsed laser beam source device
- Patent number 5,319,654
- Issue date Jun 7, 1994
- Hamamatsu Photonics K.K.
- Tsuneyuki Urakami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical wavelength shifter using nonlinear refractive medium dispos...
- Patent number 5,317,577
- Issue date May 31, 1994
- Hamamatsu Photonics K.K.
- Tsuneyuki Urakami
- G02 - OPTICS
Information Patent Grant
Optical apparatus
- Patent number 5,307,199
- Issue date Apr 26, 1994
- Hamamatsu Photonics K.K.
- Tsuneyuki Urakami
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
LASER BEAM WORKING MACHINE
- Publication number 20120006797
- Publication date Jan 12, 2012
- HAMAMATSU PHOTONICS K. K.
- Kenshi Fukumitsu
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
LASER BEAM WORKING MACHINE
- Publication number 20110274128
- Publication date Nov 10, 2011
- Hamamatsu Photonics K.K.
- Kenshi Fukumitsu
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
TOTAL REFLECTION TERAHERTZ WAVE MEASUREMENT DEVICE
- Publication number 20110249253
- Publication date Oct 13, 2011
- HAMAMATSU PHOTONICS K. K.
- Atsushi Nakanishi
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL ELEMENT, LASER BEAM OSCILLATION DEVICE AND LASER BEAM AMPLI...
- Publication number 20110222289
- Publication date Sep 15, 2011
- National Institute of Advanced Industrial Science and Technology
- Koei Yamamoto
- G02 - OPTICS
Information Patent Application
GRATING DEVICE AND METHOD OF FABRICATING THE SAME
- Publication number 20110075260
- Publication date Mar 31, 2011
- HAMAMATSU PHOTONICS K. K.
- Katsumi SHIBAYAMA
- G02 - OPTICS
Information Patent Application
OPTICAL AMPLIFYING DEVICE
- Publication number 20100091359
- Publication date Apr 15, 2010
- Koei Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SINGLE TERAHERTZ WAVE TIME-WAVEFORM MEASURING DEVICE
- Publication number 20100090112
- Publication date Apr 15, 2010
- HAMAMATSU PHOTONICS K.K.
- Yoichi Kawada
- G01 - MEASURING TESTING
Information Patent Application
TOTAL REFLECTION TERA HERTZ WAVE MEASURING APPARATUS
- Publication number 20100091266
- Publication date Apr 15, 2010
- Hamamatsu Photonics K.K.
- Takashi Yasuda
- G01 - MEASURING TESTING
Information Patent Application
Image pickup device
- Publication number 20030095255
- Publication date May 22, 2003
- Masatoshi Fujimoto
- G02 - OPTICS
Information Patent Application
Transparent medium processing device
- Publication number 20020130245
- Publication date Sep 19, 2002
- Hamamatsu Photonics K.K.
- Masatoshi Fujimoto
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Application
Radioisotope generating apparatus
- Publication number 20020106046
- Publication date Aug 8, 2002
- Hamamatsu Photonics K.K.
- Masatoshi Fujimoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Shinichiro Aoshima

Person

Patents Grantslast 30 patents

Optical amplifying device

Laser beam working machine

Laser beam working machine

Single terahertz wave time-waveform measuring device

Total reflection terahertz wave measurement device

Total reflection tera hertz wave measuring apparatus

Image pickup device

Light track observing device

Instrument for measuring lifetime of fluorescene

Transparent medium processing device

Ultrashort pulse laser apparatus

Optical delay apparatus

Voltage detection apparatus

Electro-optic apparatus for measuring an electric field of a sample

Liquid treating method and liquid treating apparatus

Voltage detection apparatus

Method of positioning an electrooptic probe of an apparatus for the...

Voltage measuring apparatus

E-O probe

System for measuring timing relationship between two signals

Electro-optic voltage detector

Voltage measuring apparatus having an electro-optic member

Polarization interferometer optical voltage detector utilizing move...

Sampling-type optical voltage detector utilizing movement of interf...

Near field scanning optical microscope

Wavelength variable laser device

Light pulse intensity regenerator, light tranforming repeater, pre-...

Pulsed laser beam source device

Optical wavelength shifter using nonlinear refractive medium dispos...

Optical apparatus

Patents Applicationslast 30 patents

LASER BEAM WORKING MACHINE

LASER BEAM WORKING MACHINE

TOTAL REFLECTION TERAHERTZ WAVE MEASUREMENT DEVICE

OPTICAL ELEMENT, LASER BEAM OSCILLATION DEVICE AND LASER BEAM AMPLI...

GRATING DEVICE AND METHOD OF FABRICATING THE SAME

OPTICAL AMPLIFYING DEVICE

SINGLE TERAHERTZ WAVE TIME-WAVEFORM MEASURING DEVICE

TOTAL REFLECTION TERA HERTZ WAVE MEASURING APPARATUS

Image pickup device

Transparent medium processing device

Radioisotope generating apparatus